“…Hillner et al, 1992;Stipp et al, 1994;Liang et al, 1996;Liang and Baer, 1997;Lea et al, 2001;De Giudici 2002) and in the presence of various organic molecules (e.g. Britt and Hlady, 1997;Hong et al, 1997;Teng and Dove, 1997;Teng et al, 1998;Orme et al, 2001 (Davis et al, 2000;Astilleros et al, 2000;Shiraki et al, 2000;Lea et al, 2001;Astilleros et al, 2002;Kamiya et al, 2002;Astilleros et al, 2003;Stipp et al, 2003;Lea et al, 2003;Hay et al, 2003;Godelitsas et al, 2003). While in situ AFM mainly shows the topographic effects of dissolution and growth processes, quantitative information on the subsequent sorption processes can be obtained using surface spectroscopic techniques such as X-ray Photoelectron Spectroscopy (XPS) and Rutherford Backscattering Spectroscopy (RBS) in combination (e.g.…”