“…The information derived from the diffraction data is averaged over a large volume ͑typically in the order of a cubic centi-meter͒; therefore, sampling statistically significant numbers of grains even in coarse-grained aggregates and special sample environments are possible. Time-of-flight ͑TOF͒ neutron diffraction is increasingly used to record textures of bulk materials, providing the additional advantage of determining textures of low symmetry phases ͑e.g., Brown et al, 2006;Xie et al, 2003͒, of composites with complex diffraction patterns ͑e.g., Ivankina et al, 2005;Wenk et al, 2001͒, or in situ experiments at high/low temperature ͑e.g., Bhattacharyya et al, 2006;Lonardelli et al, 2007;McDaniel et al, 2006;Wenk et al, 2007͒ andstress ͑Hartig et al, 2006͒. Since the Rietveld approach ͑Rietveld, 1969͒ is used to extract the texture information, it does not rely on single wellresolved diffraction peaks, as pole figure gonio metersdo, which are used for constant wavelength neutrons or X-rays. Neutron diffraction is most efficient with multidetector spectrometers such as high pressure preferred orientation ͑HIPPO͒ ͑at LANSCE, Los Alamos; Vogel et al, 2004;Wenk et al, 2003͒, GEM ͑at ISIS, U.K.;Day et al, 2004͒, or SKAT ͑at the Joint Institute for Nuclear Research, Russia; Ullemeyer et al, 1998͒, where each detector records a spectrum of crystals with lattice planes in reflection orientation.…”