“…Atomic imaging of small particles became relatively easy in the early 1980s, although there were papers such as the elegant work of Tsutomu [229] and surface studies at lower resolution [230][231][232][233][234][235][236][237] much earlier. Profile imaging was discovered in the early 1980s [11,[238][239][240], and was rapidly used and extended by many groups around the world for both profile and plan-view imaging using instruments without aberration correctors (e.g., Refs [235,[241][242][243][244][245][246][247][248][249][250][251][252][253][254][255][256]), see also [257] for other early references. Because those instruments had lanthanum hexaboride sources it was relatively easy to image the surface (as well as the bulk) [258].…”