Identifiability of single crystal plasticity parameters from residual topographies in Berkovich nanoindentation on FCC nickel

Abstract

The information richness of imprints topographies obtained after Berkovich nanoindentation tests at grain scale is assessed for identifying all or part of the parameters of a single crystal plasticity law. In a previous paper (Renner et al., 2016), the strong potential of imprints topographies has been shown through a large experimental campaign conducted on nickel samples. A 3D crystal plasticity finite element modelling (CPFEM) of the nanoindentation experiment using the Méric-Cailletaud has also showed a large sensitivity of residual topographies to the indenter/grain orientation and to the plastic parameters, including the interaction matrix coefficients specifying the interactions between dislocations on different slip systems. This makes imprints topographies very good candidates to provide information for the single crystal parameters identification. The present paper focuses on the Méric-Cailletaud law parameters identifiability using residual topographies. A method is built to define the best well-posed inverse problem to ensure the parameters identification using a crystal plasticity finite element modelling updating (CPFEMU) method. An identifiability index proposed by Richard et al. (Richard et al., 2013) for measuring the information richness of the indentation curve is extended to the analysis of residual topographies. This index quantifies the possibility to achieve a stable/unstable solution using an inverse method. For the studied behaviour, the results show that eight of the nine Méric-Cailletaud law parameters can be identified using three topographies.

Inverse Identification of Single-Crystal Plasticity Parameters of HCP Zinc from Nanoindentation Curves and Residual Topographies

“…The identification of the parameters of the CPFEM using indentation curves and residual topographies has been evaluated. Indeed, the imprint mapping is a richer observation than the indentation curve, as concluded by Bolzon et al [ 71 ] and Renner et al [ 72 ]. We have also leveraged an expensive function optimization strategy of constructing a surrogate model.…”

Controlled single and repeated impact testing for material plastic behaviour characterisation under high strain rates

“…Renner et al [ 51 ] investigated the possibility to obtain the Méric–Cailletaud constitutive parameters by inverse identification with FEA using the topography of an imprint induced by Berkovich indentation. Their analysis revealed that the imprint shape was sensitive enough to a variation of the plastic parameters to obtain all those parameters by inverse identification using several indents in different crystal orientations.…”

Simultaneous extraction of the elastic-plastic properties of a thin film and its substrate from an identifiability-based design of depth-sensing nanoindentation testing

“…It may be different indentation depths, different indenter tip geometries (Bucaille et al, 2003;Cao & Lu, 2004;Chollacoop et al, 2003;DiCarlo et al, 2003;Futakawa et al, 2001;Heinrich et al, 2009;Lan & Venkatesh, 2007;Le, 2008Le, , 2009Luo & Lin, 2007;Phadikar et al, 2013;Swaddiwudhipong et al, 2005;L. Wang et al, 2005;Yan et al, 2007Yan et al, , 2007, or by adding the topography of the residual imprint (Bocciarelli et al, 2005(Bocciarelli et al, , 2008Bolzon et al, 2004Bolzon et al, , 2009Bolzon et al, , 2011Ma et al, 2012;Renner, 2016;Renner et al, 2020).…”