2013
DOI: 10.1017/s1431927613003358
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Identification of Pharmaceutical Constituents in Finished Product Form Using Low kV Microanalysis

Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Cited by 4 publications
(3 citation statements)
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“…22 Energy-dispersive spectroscopy (EDS) is used for the semi-quantitative and qualitative analysis of the chemical elements of samples by the analysis of two types of radiations which are continuous radiation that results in the formation of the background of the measurement and the characteristic radiation of a specic wavelength resulting in the detection of the elemental composition. [23][24][25] We aimed to evaluate intervertebral disc herniation by examining AF and NP tissues of herniated human cervical and lumbar discs. We characterized the AF and NP tissues by using scanning acoustic microscopy (SAM), scanning electron microscopy (SEM) and energy-dispersive spectroscopy (EDS).…”
Section: Introductionmentioning
confidence: 99%
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“…22 Energy-dispersive spectroscopy (EDS) is used for the semi-quantitative and qualitative analysis of the chemical elements of samples by the analysis of two types of radiations which are continuous radiation that results in the formation of the background of the measurement and the characteristic radiation of a specic wavelength resulting in the detection of the elemental composition. [23][24][25] We aimed to evaluate intervertebral disc herniation by examining AF and NP tissues of herniated human cervical and lumbar discs. We characterized the AF and NP tissues by using scanning acoustic microscopy (SAM), scanning electron microscopy (SEM) and energy-dispersive spectroscopy (EDS).…”
Section: Introductionmentioning
confidence: 99%
“…22 Energy-dispersive spectroscopy (EDS) is used for the semi-quantitative and qualitative analysis of the chemical elements of samples by the analysis of two types of radiations which are continuous radiation that results in the formation of the background of the measurement and the characteristic radiation of a specific wavelength resulting in the detection of the elemental composition. 23–25…”
Section: Introductionmentioning
confidence: 99%
“…The advantages of using low energy primary electron beams (low-kV) for imaging by scanning electron microscopy (SEM) have been well established for many years [1]. Until recently [2], elemental analysis by energy dispersive x-ray spectroscopy (EDS) at low-kV was not practical. Use of a low-kV beam results in reduced x-ray signal and the inability to excite higher energy x-ray lines from higher Z elements.…”
mentioning
confidence: 99%