2007
DOI: 10.1002/pen.20820
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Identification of the possible defect states in poly(3‐hexylthiophene) thin films

Abstract: The possible origins of a low density of defect states within the highest occupied molecular orbital to lowest unoccupied molecular orbital gap are suggested for regioregular poly(3‐hexylthiophene). A number of “chemical” defects, impurities, and structural defects could contribute to features in photoemission for regioregular poly(3‐hexylthiophene), observed within the highest occupied molecular orbital to lowest unoccupied molecular orbital gap of regioregular poly(3‐hexylthiophene). POLYM. ENG. SCI., 47:135… Show more

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Cited by 14 publications
(14 citation statements)
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“…Similar to previous combined photoemission and inverse photoemission studies of P3HT, 48,49 we see that the chemical potential of RR-P3HT adjusts to place the Fermi level within the gap, between the HOMO and LUMO, similar to the band offset description for undoped RR-P3HT. 50 The semi-empirical (PM3) calculated density of states, aer a rigid energy shi of 5.3 eV to the calculated orbital energies, illustrates good supercial agreement of the combined photoemission and inverse photoemission spectra with expectations, as shown in Fig.…”
Section: The Electronic Structure Of P3htsupporting
confidence: 86%
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“…Similar to previous combined photoemission and inverse photoemission studies of P3HT, 48,49 we see that the chemical potential of RR-P3HT adjusts to place the Fermi level within the gap, between the HOMO and LUMO, similar to the band offset description for undoped RR-P3HT. 50 The semi-empirical (PM3) calculated density of states, aer a rigid energy shi of 5.3 eV to the calculated orbital energies, illustrates good supercial agreement of the combined photoemission and inverse photoemission spectra with expectations, as shown in Fig.…”
Section: The Electronic Structure Of P3htsupporting
confidence: 86%
“…2, consistent with prior work. 48,49 The semiempirical PM3 calculation, shown in Fig. 2b, reproduces the main features of the combined photoemission and inverse photoemission spectra, and, thus, the electronic structure of P3HT, but with several key failings.…”
Section: The Electronic Structure Of P3htmentioning
confidence: 77%
“…The 5.3 eV energy shift, which is, for the most part, representative of work function Φ equal to the difference of vacuum energy E vac and Fermi level E F , is applied to the calculated electronic structure uniformly. No corrections are made for final state effects or matrix element effects in either calculation, so the comparison with experiment is simplistic, but nonetheless still often successful [21][22][23][24][25][26][27]. .…”
Section: Computational Detailsmentioning
confidence: 99%
“…[8][9][10][11] In this respect, experiments have demonstrated the importance of oxygen and moisture as degradation agents also in the case of P3HT-based devices. 6,[12][13][14][15][16][17][18][19][20][21][22] Specifically, exposure of these systems to air leads to the creation of shallow 13,23,24 and deep 6,13,22,[25][26][27] carrier traps. Even though the formation of shallow traps may lead to p-type doping of the organic semiconductor, 23,[28][29][30][31] overall, the creation of trap sites is detrimental for the performance of the material as it limits carrier mobilities.…”
Section: Introductionmentioning
confidence: 99%