IEEE Nuclear and Space Radiation Effects Conference: Notes on the Early Conferences

Abstract

This paper gathers the remembrances of several key contributors who participated in the earliest Institute of Electrical and Electronics Engineers (IEEE) Nuclear and Space Radiation Effects Conferences (NSREC).

Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation

“…[2] As is well known, total dose irradiation in insulating material results in cumulative parametric degradation in electronics and finally leads to functional failure, so we need to perform functional testing to ensure their functionalities in hardness assurance testing. [3,4] Functional testing for electronics requires the application of test vectors to inputs and monitoring the output for correct results, and test vectors are designed based on functional failure modes of devices. [5] However, it is difficult to identify functional failure modes of COTS advanced electronics induced by radiation, because the more advanced functions and detailed information are trapped at a die level, and COTS devices are "black box" that anyone outside the original equipment manufacturer only has access to the high-level functions of a device.…”