2022
DOI: 10.1039/d2fd00059h
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Image processing tools for the validation of CryoEM maps

Abstract: The number of maps deposited at public databases (Electron Microscopy Data Bank, EMDB) determined by Cryo-Electron Microscopy is quickly growing in recent years. With this rapid growth, it is critical...

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Cited by 2 publications
(2 citation statements)
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“…φ} coincides with that of R(1) in (B 42),. and similarly the conditional distribution of R1 on the event{|N 1 [k]| = n, ϕ N 1 [k] = ϕ X [k] + φ + π} coincides with that of R(2) in (B.43).…”
mentioning
confidence: 79%
See 1 more Smart Citation
“…φ} coincides with that of R(1) in (B 42),. and similarly the conditional distribution of R1 on the event{|N 1 [k]| = n, ϕ N 1 [k] = ϕ X [k] + φ + π} coincides with that of R(2) in (B.43).…”
mentioning
confidence: 79%
“…This precautionary approach aims to mitigate the risk of erroneous fittings, which could ultimately lead to inaccuracies in 3D density map reconstruction. Model bias is still a fundamental problem in cryo-EM, as highlighted by an ongoing debate concerning validation tools, see for example, [43,36,19,11,12,20,21,42].…”
Section: Cryo-em and Empirical Demonstrationmentioning
confidence: 99%