2020
DOI: 10.1002/adma.201907619
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Imaging Beam‐Sensitive Materials by Electron Microscopy

Abstract: Electron microscopy allows the extraction of multidimensional spatiotemporally correlated structural information of diverse materials down to atomic resolution, which is essential for figuring out their structureproperty relationships. Unfortunately, the high-energy electrons that carry this important information can cause damage by modulating the structures of the materials. This has become a significant problem concerning the recent boost in materials science applications of a wide range of beam-sensitive ma… Show more

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Cited by 147 publications
(138 citation statements)
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References 393 publications
(690 reference statements)
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“…The interested reader is directed towards a recent review on imaging beam sensitive materials via electron microscopy. 226 2.3.2 Scanning probe microscopies. Operando and in situ electron microscopy studies are still performed only by a few expert groups, whereas scanning probe microscopy (SPM) methods can be employed in vacuum, ambient condition or in situ/operando experiments.…”
Section: Reproduced From Ref 153 With Permission From John Wiley Andmentioning
confidence: 99%
“…The interested reader is directed towards a recent review on imaging beam sensitive materials via electron microscopy. 226 2.3.2 Scanning probe microscopies. Operando and in situ electron microscopy studies are still performed only by a few expert groups, whereas scanning probe microscopy (SPM) methods can be employed in vacuum, ambient condition or in situ/operando experiments.…”
Section: Reproduced From Ref 153 With Permission From John Wiley Andmentioning
confidence: 99%
“…1. However, an established drawback of TEM is electron beaminduced sample damage caused by complex interaction mechanisms such as radiolysis, atomic displacement (so-called 'knock-on') and Joule heating [16][17][18] . The electron beam has the ability to structurally and chemically change these types of materials during TEM characterization.…”
Section: Introductionmentioning
confidence: 99%
“…We have fitted each two-dimensional (2D) reciprocal space maps (RSMs) of the {110} reflections to determine the fading curves of the diffraction intensity using a symmetrical 2D Gaussian function. The {110} reflections contain four peaks: (110), (-110), (-1-10) and (1)(2)(3)(4)(5)(6)(7)(8)(9)(10).…”
Section: Fig 1a Illustrates a Pulsed Electron Beam Generated By The Nmentioning
confidence: 99%
“…The Bragg peak intensity decay as a function of the accumulated total dose is evidence of increasing crystal disorder and irreversible structural damage 5,7,22 . Dynamic scattering effects are negligible in thin samples.…”
Section: Calibrating Radiation Damage In Organic C 36 H 74 Paraffin Cmentioning
confidence: 99%
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