Imaging elastic sample properties with an atomic force microscope operating in the tapping mode

Höper, R.; Gesang, T.; Possart, W.; Hennemann, O.‐D.; Boseck, S.

doi:10.1016/0304-3991(95)00068-c

Cited by 68 publications

(54 citation statements)

References 12 publications

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“…In this mode, variation of the tip-to-sample force can be achieved by changing the driving amplitude and the set-point amplitude A 0 and A sp . The effective tip-to-sample force increases with the increase of A 0 and/or the difference, A 0 − A sp (11). In the tapping mode, in contrast to the contact mode, the height images show minor, and for many samples, barely detectable variations with changes in the force.…”

Section: Tapping Modementioning

confidence: 85%

Characterization of Polymer Surfaces With Atomic Force Microscopy

Magonov¹,

Reneker

1997

Annu. Rev. Mater. Sci.

411

295

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Applications of state-of-the-art atomic force microscopy methods to the elucidation of the surface and near-surface structure of polymeric solids are described. Contact, tapping, force modulation, frictional force, and other modes of atomic force microscopy are described, and recent results are summarized. Conformational and chain order, crystalline order, polymer crystals, lamellar structures, lamellar surfaces, fold surfaces, and fibers and films with highly oriented molecules all yield important information. Controlled deformation of polymer surfaces, both reversible and irreversible, with the atomic force microscope, provides a wealth of information about mechanical properties on a nanometer scale. The observation of phase-separated regions and of polymer crystals lying below a smooth surface shows that not only topography but also elastic inhomogeneity can be observed in great detail with the atomic force microscope. This is a rapidly developing field, and some indications of future developments are presented. PROBING SURFACES WITH AFMScanning probe microscopy constitutes a family of advanced techniques for surface analysis (1a,b,c). Although scanning tunneling microscopy (STM) was invented first, the current progress in scanning probe microscopy of polymers is largely in the development of atomic force microscopy (AFM). The universal character of the repulsive forces between the tip and the sample, which are 175 0084-6600/97/0801-0175$08.00 Annu. Rev. Mater. Sci. 1997.27:175-222. Downloaded from www.annualreviews.org by NORTH CAROLINA STATE UNIVERSITY on 10/18/12. For personal use only.

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Section: Tapping Modementioning

confidence: 85%

Characterization of Polymer Surfaces With Atomic Force Microscopy

Magonov¹,

Reneker

1997

Annu. Rev. Mater. Sci.

411

295

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“…[1][2][3][4] In this mode, a piezoelectric driver excites a cantilever into a resonance oscillation and the vibrating tip contacts with the sample surface intermittently. [5][6][7][8] The experiment results have shown the complicate nonlinear phenomena in tapping mode AFM.…”

Section: ͓S0003-6951͑98͒04551-3͔mentioning

confidence: 99%

Analytical descriptions of the tapping-mode atomic force microscopy response

Wang¹

1998

Applied Physics Letters

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The tapping-mode atomic force microscopy response has been analyzed by the Krylov–Bogolubov–Mitropolsky asymptotic method. Due to the presence of repulsive force, attractive force and damping in the tip-sample interaction, the response exhibits complicate nonlinear phenomena. The numerical and experimental results shows that the phenomena can be well described by this approximation solution when the driving frequency is close to the free resonance frequency and the setpoint amplitude ratio is larger than 0.4.

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“…The AFM used is a Dimension 3100 linked to a NanoScope III controller from Digital Instrument (Veeco Instruments). For each film, the areas of 1 × 1 and 10 × 10 μm 2 were scanned using the tapping™ mode at an engagement set point of 2 Volts to minimise damage to the samples [22]. Single crystal silicon tip with a spring constant of 60 N m − 1 was used.…”

Section: Morphological Characterisationmentioning

confidence: 99%