1990
DOI: 10.1111/j.1365-2818.1990.tb03053.x
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Imaging in scanning microscopes with slit‐shaped detectors

Abstract: K E Y w ORDS . Scanning microscopy, confocal systems, image formation, confocal design. SUMMARYWe consider the imaging in scanning microscopes employing point and slit-shaped detectors in both the bright-field and fluorescent mode. In particular we consider the three-dimensional aspects of the imaging and show inter alza that acceptable, albeit asymmetrical, images result from a slit detector system at low levels of defocus. The situation becomes worse as the defocus is increased although acceptable extendedfo… Show more

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Cited by 37 publications
(20 citation statements)
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“…The transverse resolution is defined as the transition width from the 10% to the 90% power points of the transverse response curve. These resolution measurements are consistent with calculations based on diffraction theory, as presented previously [9, 16, 25, 26] . In both cases, the background is higher (contrast is lower) for the line-scanned configuration due to the loss of confocality along one dimension.…”
supporting
confidence: 91%
See 1 more Smart Citation
“…The transverse resolution is defined as the transition width from the 10% to the 90% power points of the transverse response curve. These resolution measurements are consistent with calculations based on diffraction theory, as presented previously [9, 16, 25, 26] . In both cases, the background is higher (contrast is lower) for the line-scanned configuration due to the loss of confocality along one dimension.…”
supporting
confidence: 91%
“…In addition to improving the imaging speed, a line-scanned (LS) system can potentially increase the signal-to-noise ratio (SNR) compared to a point-scanned (PS) system by increasing pixel dwell times by two to three orders of magnitude for a given frame rate and field of view; however, photobleaching may ultimately limit the achievable SNR. There are also tradeoffs in imaging performance due to the loss of confocality along the focal line, resulting in a diminished optical sectioning capability [3, 4, 17, 25, 26] , and consequently a limited imaging depth.…”
mentioning
confidence: 99%
“…Patterns of varying types have been evaluated in the literature, both theoretically and experimentally (Wilson & Hewlett, 1990;Wilson, 1991;Conchello & Lichtman, 1994;Sandison & Webb, 1994;Jus Ïkaitis et al, 1996;Wilson et al, 1996;Fewer et al, 1997;Neil et al, 1997;Neil et al, 1998). The use of structured illumination patterns raises the further issues of how the structure of the pattern degrades with depth in a sample and what effect this has on the axial response.…”
Section: Discussionmentioning
confidence: 99%
“…To enable us to make some comparisons among various systems, we therefore arbitrarily choose the half-width at half-maximum of the I(u) curves as a measure of the optical sectioning strength. In doing so, we should remember that we are considering a specific object and that not all objects possess identical sectioning strengths (Wilson and Hewlett 1990a).…”
Section: Introductionmentioning
confidence: 99%