Imaging of charge trapping in distorted carbon nanotubes by x-ray excited scanning probe microscopy

Abstract

We have observed the distribution of electron trapping centers on distorted carbon nanotubes ͑CNTs͒ by a unique x-ray analysis technique that has both elemental and spatial selectivities. This technique involves the use of scanning probe microscopy ͑SPM͒ under synchrotron radiation excitation of the inner shell of carbon. The probe detects the Coulomb force that results from the relaxation of an electron bound to a defect site into the core hole state created by x-ray photon absorption. This results in a change in charge state of the defect. At the spatial resolution provided by the SPM technique, we observed the electron trapping centers distributed on the compressed and torsionally distorted CNTs. This direct association of mechanical distortion with defect sites indicates a potential risk of deterioration of electric properties during the fabrication and processing of CNT networks.

Static states and dynamic behaviour of charges: observation and control by scanning probe microscopy

“…This review mainly discussed the spatial and time resolutions in charge observations using SPM. Other SPM applications using the charge transition between an inner shell and a valence shell and its application to local structure analyses [91,92] were remarked upon as a postscript.…”

A single probe for imaging photons, electrons and physical forces

“…The combination of these two techniques, SPM and x-ray microscopy, can bring unprecedented access to the local structural properties and chemical composition. Therefore, there has been significant effort during the last decade to combine these two techniques [8][9][10][11][12][13][14][15][16][17][18][19]. In particular, instruments combining scanning force microscopy (SFM) and x-ray microscopy have been developed at various synchrotrons [14][15][16][17][18][19].…”

“…Therefore, there has been significant effort during the last decade to combine these two techniques [8][9][10][11][12][13][14][15][16][17][18][19]. In particular, instruments combining scanning force microscopy (SFM) and x-ray microscopy have been developed at various synchrotrons [14][15][16][17][18][19]. The goals of such a combination are three-fold.…”

Versatile atomic force microscopy setup combined with micro-focused X-ray beam

“…Multiple approaches have been developed for simultaneous analysis of nanostructures using Scanning Probe Microscopy (SPM) and X-ray methods. SPM techniques such as Atomic Force Microscopy (AFM) and scanning tunneling microscopy (STM) have already been combined with the micro-focused X-ray beams [1][2][3][4][5][6][7][8][9] . It has been shown that morphology and material sensitivity of the scanning methods combined with versatility of X-ray methods opens new opportunities for dedicated research of nanoworld.…”