2002
DOI: 10.1039/b209827j
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Imaging TOF-SIMS analysis of oligonucleotide microarrays

Abstract: Single strand thiolated oligonucleotide (25-mer) was printed onto chemically modified glass and silicon surfaces. Confirmation of the level of attachment attained in each case was effected through detection by conventional confocal fluorescence microscopy. Both positive-ion and negative ion imaging time-of-flight mass spectra were recorded for the visualization of micro-patterned oligonucleotide arrays. This represents the first report of such detection by this form of mass spectrometry on glass. Ultimately, w… Show more

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Cited by 14 publications
(12 citation statements)
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“…The surfaces patterned with oligonucleotides were analyzed by time-of-flight secondary ion mass spectrometry (ToF-SIMS). 134.03 (A À , adenine) and m/z = 110.01 (C À , cytosine)) 48 immobilized in a patterned fashion following the mask's features.…”
Section: Resultsmentioning
confidence: 99%
“…The surfaces patterned with oligonucleotides were analyzed by time-of-flight secondary ion mass spectrometry (ToF-SIMS). 134.03 (A À , adenine) and m/z = 110.01 (C À , cytosine)) 48 immobilized in a patterned fashion following the mask's features.…”
Section: Resultsmentioning
confidence: 99%
“…In this type of analysis, mass spectrometry was used for sequencing; for example, exons of the p53 gene and for genotyping . In 2003, Cheran et al used imaging time‐of‐flight secondary‐ion mass spectrometry (TOF‐SIMS) for the recognition of the spatial distribution of DNA strands. Meanwhile, MALDI‐MS imaging is the method of choice in obtaining much of information for many different reaction sites.…”
Section: Miniaturized Synthesis and Molecule Librariesmentioning
confidence: 99%
“…Different techniques have been developed to prepare such arrays, including printing [1][2][3] and photolithography 4 as the most popular approaches. Different techniques have been developed to prepare such arrays, including printing [1][2][3] and photolithography 4 as the most popular approaches.…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3]5,6 Both techniques rely on surface-sensitive characteristic signals 7 that reveal the chemical state and atomic concentration (XPS) or the molecular composition (TOF-SIMS). Especially two methods with unique specificity and sensitivity namely X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) have been widely applied to examine DNA spots.…”
Section: Introductionmentioning
confidence: 99%