Abstract:The impact of a single event on the performance of CMOS current mirrors (CMs) is studied experimentally in this paper. Both basic and cascode CMs based on bulk Si and PDSOI substrates are employed to demonstrate the permanent effects of damage generated by heavy-ion strikes. The results show that the mismatch of the CMs (bulk Si/PDSOI basic/cascode CMs) changes after heavy-ion irradiation, which means that the accuracy of the output current may need re-evaluation when CMs are operated in a harsh environment. F… Show more
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