Impact of Micro-Cracks on the Degradation of Solar Cell Performance Based On Two-Diode Model Parameters

Mölken, J.I. van; Yusufoğlu, U.A.; Safiei, A.; Windgassen, H.; Khandelwal, R.; Pletzer, T.M.; Kurz, H.

doi:10.1016/j.egypro.2012.07.046

Cited by 38 publications

(23 citation statements)

References 7 publications

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“…Electroluminescence (EL) imaging method is used to scan the surface of the PV modules, the light output increases with the local voltage so that regions with poor contact show up as dark spots [6]. The thermography technique is simpler to implement, but the accuracy of the image is lower than with the EL technique, and does not allow the estimation of the area (in mm 2 ) that is broken in the solar cells [7].…”

Section: Introductionmentioning

confidence: 99%

The impact of cracks on the performance of photovoltaic modules

Dhimish

Holmes

Dales

et al. 2017

2017 IEEE Manchester PowerTech

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Abstract-This paper presents a statistical approach for identifying the significant impact of cracks on the output power performance of photovoltaic (PV) modules. Since there are a few statistical analysis of data for investigating the impact of cracks in PV modules in real-time long-term data measurements. Therefore, this paper will demonstrate a statistical approach which uses two statistical techniques: T-test and F-test. Electroluminescence (EL) method is used to scan possible cracks in the examined PV modules. Moreover, virtual instrumentation (VI) LabVIEW software is used to predict the theoretical output power performance of the examined PV modules based on the analysis of I-V and P-V curves. The statistical analysis approach has been validated using 45 polycrystalline PV modules at the University of Huddersfield, UK.

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Section: Introductionmentioning

confidence: 99%

The impact of cracks on the performance of photovoltaic modules

Dhimish

Holmes

Dales

et al. 2017

2017 IEEE Manchester PowerTech

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“…As was shown by van Mölken, et al . , the stability of this ratio image method is proven with average parameters for different solar cell batches. Figure (a) shows the EL image of the mc‐Si solar cell before any crack formation.…”

Section: Resultsmentioning

confidence: 93%

“…Electroluminescence (EL) camera based imaging is a well‐established measurement technique to identify cracks in solar cells and to characterise cells as well as PV modules in a fast way with high resolution. Furthermore, the preparing of ratio images with EL images before and after crack formation allows a detailed investigation of cracks. Cracks can also be identified with the dark lock‐in thermography (DLIT) .…”

Section: Introductionmentioning

confidence: 99%

Influence of cracks on the local current–voltage parameters of silicon solar cells

Pletzer

Mölken

Rißland

et al. 2013

Progress in Photovoltaics

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The existence of cracks in silicon solar cells can drastically reduce the electrical performance of an individual cell and even of an entire photovoltaic module. An in-depth understanding of the influence of cracks on solar cells enables therefore calculations of the crack impact and other following effects on module level. This paper shows a detailed analysis of the electrical influence of cracks with two different spatially resolved methods including global and local current-voltage characteristics. The main influence of cracks is an increased recombination current density in the depletion region, which is clearly shown by spatially resolved dark lock-in thermography measurements with local current-voltage investigation. This increased recombination current density affects further cell parameters such as the efficiency, which is confirmed also by the global current-voltage characteristics. The additionally used ratio image technique based on electroluminescence measurements is in comparison with the local current-voltage method, the more reliable and faster method for the crack detection itself, and allows on cell-level and module-level a continuous inspection of cracks.

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“…Important cracks defects are displayed in all Figures 3,4 and 5. The actual potential impact of this defect on the electrical solar cell parameters is studied in reference [10]. Factually selected area of poly-Si solar cell sample was measured with a linear polarizing filter.…”

Section: Resultsmentioning

confidence: 99%

Progression of Silicon Solar Cells Luminescence Diagnostic Methods

Stojan¹,

Vaněk²,

Malý³

2014

ujeee

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Diagnostic of silicon solar cells defects is permanently one of most important steps in production of solar cells. Specify of diagnostic methods leads to a better understanding and more detailed analysis of manufactured cells. Luminescence methods of solar cells are fast and some of the most common methods today. According to the excitation method of luminescence radiation from silicon solar cells we talk about electroluminescence or photoluminescence methods. Spectral response of using CCD camera with those methods is in band-gap infrared wave length area. The main idea of this paper is to analyze emitted infrared radiation silicon solar cell under the forward bias by polarization spectroscopy. This analysis opens up for potential next new questions in diagnostics defects silicon solar cells by luminescence methods.

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Impact of Micro-Cracks on the Degradation of Solar Cell Performance Based On Two-Diode Model Parameters

Cited by 38 publications

References 7 publications

The impact of cracks on the performance of photovoltaic modules

The impact of cracks on the performance of photovoltaic modules

Influence of cracks on the local current–voltage parameters of silicon solar cells

Progression of Silicon Solar Cells Luminescence Diagnostic Methods

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