Impact of neutron flux on soft errors in MOS memories

Eto, Akihisa; Hidaka, Mutsuo; Okuyama, Yutaka; Kimura, Kazushige; Hosono, Masao

doi:10.1109/iedm.1998.746376

Cited by 13 publications

(2 citation statements)

References 5 publications

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“…Flash memory superiority over SRAM was also observed by Doucin [4] and by Eto [5]. Doucin fmds Flash cross section to be four orders of magnitude smaller than SRAM and DRAM.…”

Section: Introductionmentioning

confidence: 65%

Flash memory under cosmic & alpha irradiation

Fogle

Darling

Blish

et al.

2004 IEEE International Reliability Physics Symposium. Proceedings

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Advanced Micro Devices 1 AMD Place, MS 124, Sunnyvale, CA 94088-3453 1 408 749 5838,l (408) 748-5585 fax, Richard.Blish@AMD.com Type I I polysi I Poly Si I MirrorBiP Part# I I 2YDL640G I 2YLV160D I 2YLV64OMH ABSTRACTNeutron and proton irradiation to simulate cosmic ray jeopardy were used to establish that NOR Flash memory (conventional floating polySi gate or ONO floating gate MhorBitTu) soft m r failure rate (cross section) is 4-5 orders of magnitude better than

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“…Flash memory superiority over SRAM was also observed by Doucin [4] and by Eto [5]. Doucin fmds Flash cross section to be four orders of magnitude smaller than SRAM and DRAM.…”

Section: Introductionmentioning

confidence: 65%

Flash memory under cosmic & alpha irradiation

Fogle

Darling

Blish

et al.

2004 IEEE International Reliability Physics Symposium. Proceedings

View full text Add to dashboard Cite

show abstract

“…At the microscopic level of system design, such as memory chips, components become more complex each generation. Density, size and geometry combine to make component cross-sections grow [7]. At the macroscopic scale, large multiprocessor and multi-FPGA systems are becoming common.…”

Section: Introductionmentioning

confidence: 99%

Terrestrial-Based Radiation Upsets: A Cautionary Tale

Quinn

Graham

13th Annual IEEE Symposium on Field-Programmable Custom Computing Machines (FCCM'05)

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Problems with terrestrial-based neutron radiation from cosmic rays have become more commonplace. While the incident rate from neutron radiation is lower than space-based radiation, physics, system design and system locations have combined to make systems increasingly vulnerable to terrestrial radiation. FPGA systems are particularly sensitive to neutron radiation, as the FPGAs, microprocessors and memory are all sensitive to upsets. We are interested in reconfigurable supercomputers,which need to be highly reliable and highly available despite being very sensitive to radiation. In this paper, we estimate the error rate for FPGAs, memory, and microprocessors so that predictions for the sensitivity of the Cray XD1 reconfigurable supercomputer can be made. We also present possible mitigation methods that are appropriate for neutron radiation upset rates.

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Digital CMOS Fault Modeling

Sachdev

Gyvez

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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Impact of neutron flux on soft errors in MOS memories

Cited by 13 publications

References 5 publications

Flash memory under cosmic & alpha irradiation

Flash memory under cosmic & alpha irradiation

Terrestrial-Based Radiation Upsets: A Cautionary Tale

Digital CMOS Fault Modeling

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