We investigate time-dependent diffusion mechanisms beyond two-dipole Forster resonance energy transfer (FRET). We demonstrate that the diffusion of excitons in thin films of quantum dots can be divided into two regimes depending on the excitation light intensity. Under a low-intensity regime, excited quantum dots do not interact with one another and a standard two-dipole FRET mechanism can be assumed as the source of a random walk process. As a result, there is a minimum amount of diffusion that will occur independently of the excitation power. In a high-intensity regime, a large number of quantum dots interact, inducing an energy transfer mechanism that surpasses two-dipole FRET in both range and rate. This process, which exhibits superradiance signatures, is temporary, occurring only when there is a large density of excitons present. Additionally, we utilize a phenomenon called oxidation hole burning (OHB) to pattern the lifetimes of excitons in quantum dot thin films laterally in an attempt to control diffusion rates and directionality.