2015 European Conference on Optical Communication (ECOC) 2015
DOI: 10.1109/ecoc.2015.7341725
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Impact of process variability of active ring resonators in a 300mm silicon photonic platform

Abstract: We study the process variability impact of silicon ring modulators on resonance wavelength, which is a key parameter to design WDM communication systems based on those devices.

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Cited by 11 publications
(3 citation statements)
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“…RMs exhibit the advantages of compact footprint, low modulation power and can reach very high data rates [39]. Unfortunately, they also suffer from a significant thermal sensitivity and high dependence on fabrication tolerance [40]. On the other hand, MZMs can offer high modulation speed, and are more tolerant to thermal and fabrication variations.…”
Section: Design Principlesmentioning
confidence: 99%
“…RMs exhibit the advantages of compact footprint, low modulation power and can reach very high data rates [39]. Unfortunately, they also suffer from a significant thermal sensitivity and high dependence on fabrication tolerance [40]. On the other hand, MZMs can offer high modulation speed, and are more tolerant to thermal and fabrication variations.…”
Section: Design Principlesmentioning
confidence: 99%
“…However, the design differences required for PDs and MODs can significantly increase the complexity and the cost of fabrication as well as the electrical circuit design for wavelength control/trimming [9][10][11][12][13][14][15] and stabilization in the 300 mm silicon photonics platform [16][17][18]. Therefore, a universal structure with both high-speed modulation and detection operation will greatly enhance the silicon photonics integration level at low cost and can enrich programmable photonics circuits with more flexibility for light detection and modulation.…”
Section: Introductionmentioning
confidence: 99%
“…As an example Fig. 8 is showing the co-integration of supplementary Si-etch steps allowing the fabrication of Ring Resonators [4]. Such devices are promising candidates for the dense WDM integration in chip to chip communication.…”
Section: Introductionmentioning
confidence: 99%