Impact of Pt bottom electrode on the properties of ferroelectric Bi3.25La0.75Ti3O12 capacitors

Development of crack free BLT thick films by chemical solution deposition technique

“…From the AFM scans it is observed that the films exhibit granular morphology with grain sizes varying from 50 nm to 100 nm. This is in contrast to the earlier literature on BLT thin films where grain sizes in the range of 80-200 nm were reported [20,21]. The presence of finer grain size in our study may be attributed to the chemical processing of the BLT thin film with PVP additive.…”

“…HRTEM image revealed the lattice-fringes of a BLT grain (Fig.5d). From the micrograph, the measured inter-planar spacing is 2.97 Å which corresponds to the (117) , stronger (006) orientation(c-axis) [28], stronger (117) orientation (a-axis) [21]. This result is also comparable to the PLD grown BLT films [4] and BLT films deposited by pulsed DC sputtering [29], although, higher values of remnant polarization are reported for epitaxial films having a-axis orientation.…”

Low-temperature fabrication and properties of the highly oriented Bi3.15Nd0.85Ti3O12 thin films deposited on different substrates

“…1. Therefore, a larger Pr of our sample is observed compared with (1 1 7)-and random-oriented BLnT films [24,25].…”

Microstructure and Ferroelectric Properties of Direct-Patternable Bi3.25La0.75Ti3O12Films Prepared by Photochemical Metal-Organic Deposition

“…Figure 3 presents XRD spectra of direct-patternable BLT films deposited on Pt(111)/TiO 2 /SiO 2 /Si substrates and annealed from 550 to 700 • C at increments of 50 • C. All the diffraction peaks corresponded to BLT and the Pt substrate. The diffraction intensities showed a distribution similar to BLT ceramics [16], and Pt(111) was found to not influence the growth orientation of BLT films [17].…”