International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224)
DOI: 10.1109/iedm.2001.979521
|View full text |Cite
|
Sign up to set email alerts
|

Impact of rapid thermal annealing on data retention time for 256 Mb and 1 Gb DRAM technology

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Publication Types

Select...
4
2

Relationship

0
6

Authors

Journals

citations
Cited by 7 publications
(1 citation statement)
references
References 3 publications
0
1
0
Order By: Relevance
“…During friction stir processing, in addition to severe plastic deformation, the material also undergoes dynamic recrystallization, which results in a large fraction of high angle grain boundaries [3]. AA 2024 [30] AA 7075 [29] AA 6061 [24] E u E u Al [23] Al3Mg [23] A8011 ARB [26] A3004 [22] A6061 [22] A1100 [22] Total Elongation (%)…”
Section: Effect Of Grain Boundary Character On Ductilitymentioning
confidence: 99%
“…During friction stir processing, in addition to severe plastic deformation, the material also undergoes dynamic recrystallization, which results in a large fraction of high angle grain boundaries [3]. AA 2024 [30] AA 7075 [29] AA 6061 [24] E u E u Al [23] Al3Mg [23] A8011 ARB [26] A3004 [22] A6061 [22] A1100 [22] Total Elongation (%)…”
Section: Effect Of Grain Boundary Character On Ductilitymentioning
confidence: 99%