2011
DOI: 10.1109/ted.2011.2160265
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Impact of Temperature on the Resistive Switching Behavior of Embedded $\hbox{HfO}_{2}$-Based RRAM Devices

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Cited by 217 publications
(133 citation statements)
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“…However, there are remaining challenges for quantizing the resistance of the memristor into discrete states at standard conditions. Deviations from the programmed resistance value are expected mostly due to temperature effects [27]. An ensemble of memristor devices is expected to produce even higher level of variations due to uncertainty in device critical dimensions and due to other small variations between (presumably identical) devices.…”
Section: Basic Conceptmentioning
confidence: 99%
“…However, there are remaining challenges for quantizing the resistance of the memristor into discrete states at standard conditions. Deviations from the programmed resistance value are expected mostly due to temperature effects [27]. An ensemble of memristor devices is expected to produce even higher level of variations due to uncertainty in device critical dimensions and due to other small variations between (presumably identical) devices.…”
Section: Basic Conceptmentioning
confidence: 99%
“…, where x is the location of the filament constriction as measured from the carrierinjecting (cathodic) nanowire and t ox is the oxide thickness. 31 In NiO thin films, it is suggested that conducting filaments grow from the cathode to the anode, 4 so we expect the filament constriction to be located within the oxide of the anodic nanowire. Using c ¼ 1, we find that the data in Figure 2 If the barrier UðTÞ is known, the radius of the filament constriction at its narrowest point can be estimated through the following equation:…”
mentioning
confidence: 93%
“…Based on current-voltage (IV) and temperature-dependent resistance (R(T)) data, the metallic LRS behaves as a conventional metallic resistance in series with a small barrier, while the semiconducting LRS behaves as an atomically thin quantum point contact (QPC). [30][31][32][33][34][35] QPC conduction has been previously observed in HfO 2 devices, 34,36 but has not been documented in NiO systems. These observations suggest that the metallic (semiconducting) LRS derives from wide (narrow) filament constrictions that are preferentially achieved by executing either a single-or multi-step electroformation process.…”
mentioning
confidence: 99%
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