2021
DOI: 10.1007/s00339-021-04552-3
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Impact of TiO2 buffer layer on the ferroelectric photovoltaic response of CSD grown PZT thick films

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Cited by 7 publications
(2 citation statements)
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“…In the crystallinity of LNO/PZT/IGZO heterostructure, as shown in figure 6, it is revealed that both the PZT and IGZO have shown good crystallinity. For IGZO film, this heating temperature is fit for crystallization [17], but for PZT film, the crystallization temperature is always above 600 °C [18]. The good crystallization of both PZT and IGZO may be attributed to the UV irradiation during the gel film formation.…”
Section: Resultsmentioning
confidence: 93%
“…In the crystallinity of LNO/PZT/IGZO heterostructure, as shown in figure 6, it is revealed that both the PZT and IGZO have shown good crystallinity. For IGZO film, this heating temperature is fit for crystallization [17], but for PZT film, the crystallization temperature is always above 600 °C [18]. The good crystallization of both PZT and IGZO may be attributed to the UV irradiation during the gel film formation.…”
Section: Resultsmentioning
confidence: 93%
“…The preparation process of PZT ferroelectric thin film is shown in Fig. 8 [30]. (PZT / PTO) ferroelectric thin films.…”
Section: Rainbow Encoding Conversion Curvementioning
confidence: 99%