Impacts of censoring on lifetime analysis by two-step probability plot in defect clustered TDDB

Yokogawa, Shinji

doi:10.1109/irps.2017.7936360

Cited by 4 publications

(10 citation statements)

References 16 publications

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“…27,28) The two-step probability plot is used to easily obtain the parameters of GBXII distribution by using a solver tool and a specific plot as follows. STEP 1: Let α be the estimated value that maximizes the correlation coefficient (≤1) between log½RðtÞ À1= À 1 and log t with a solver.…”

Section: Parameter Estimation Methodsmentioning

confidence: 99%

“…3,4,[25][26][27][28][29] The model has two shape parameters and is called the generalized Burr-type XII (GBXII) distribution in statistics. 30,31) The cumulative probability function of the lifetime distribution with defect clustering is described by the BXII distribution as…”

Section: Distribution Functionmentioning

confidence: 99%

“…A complicated shape of the TDDB lifetime distribution 3,4,[25][26][27][28][29] is represented by both the intrinsic variation of TDDB and the physical variation of acceleration stress. Therefore, large-scale observation of lifetime is required for evaluating the lifetime distribution of TDDB affected by the clustering defect.…”

Section: Introductionmentioning

confidence: 99%

“…A two-step probability plot 27,28) and Monte Carlo simulation (MCS) will be used for the study of statistical estimation accuracy. Merits of the multilink test and a combination effect will be discussed on the basis of statistical accuracy.…”

Section: Introductionmentioning

confidence: 99%

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Statistical evaluation method for lifetime distribution in field-accelerated time-dependent dielectric breakdown using two-step probability plot and multilink test scheme

Tate

Yokogawa

2018

Jpn. J. Appl. Phys.

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A concept of a multilink test scheme with a two-step probability plot and its statistical accuracy of estimation are investigated for the timedependent dielectric breakdown under defect clustering condition in the back end of line and middle of line. It is useful for obtaining an accurate estimation of lifetime that explains a complicated distribution shape due to impacts of clustered defects. Furthermore, applying a regression of the electric field dependence of breakdown to the lifetime distribution analysis will provide a more accurate estimation.

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Section: Parameter Estimation Methodsmentioning

confidence: 99%

Section: Distribution Functionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Statistical evaluation method for lifetime distribution in field-accelerated time-dependent dielectric breakdown using two-step probability plot and multilink test scheme

Tate

Yokogawa

2018

Jpn. J. Appl. Phys.

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“…Impacts of the right-side censoring are investigated in. 42) 3.4. Covering estimate accuracy of small size data An estimation of the trade-off between the cluster and shape parameters has been reported for a small sample size.…”

mentioning

confidence: 99%

Applications of lifetime distribution functions with two shape parameters for reliability analysis in advanced interconnect technologies: a brief review

Yokogawa¹

2020

Jpn. J. Appl. Phys.

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In this brief review, applications of lifetime distribution functions with two shape parameters for reliability analysis are introduced in advanced interconnect technologies. For the time-dependent dielectric breakdown analysis, the time-dependent clustering model is applied. Suppressing the trade-off between two shape parameters is required for an accurate estimation of the clustering parameter. Some statistical techniques, including the sudden-death test structure and the Bayesian inference, are reviewed. For simple electromigration evaluation on a chip-level, an adaption of the generalized Gamma distribution is proposed. The impacts of the circuit scale and the segment variations are investigated with the Monte-Carlo technique. This review suggests that variation control will become ever more important for advanced interconnect technology developments.

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Reliability evaluation of defect accounted time-dependent dielectric breakdown with competing-mixture distribution

Yokogawa

Tate

2018

2018 IEEE International Reliability Physics Symposium (IRPS)

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Impacts of censoring on lifetime analysis by two-step probability plot in defect clustered TDDB

Cited by 4 publications

References 16 publications

Statistical evaluation method for lifetime distribution in field-accelerated time-dependent dielectric breakdown using two-step probability plot and multilink test scheme

Statistical evaluation method for lifetime distribution in field-accelerated time-dependent dielectric breakdown using two-step probability plot and multilink test scheme

Applications of lifetime distribution functions with two shape parameters for reliability analysis in advanced interconnect technologies: a brief review

Reliability evaluation of defect accounted time-dependent dielectric breakdown with competing-mixture distribution

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