2021
DOI: 10.1021/acs.jpclett.1c03565
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Impacts of the Electron Transport Layer Surface Reconstruction on the Buried Interface in Perovskite Optoelectronic Devices

Abstract: Using density functional theory combined with ab initio molecular dynamics, we comprehensively investigated the performance enhancement mechanism of the device after surface reconstruction by passivating different halogen groups (i.e., F or Cl) at the ETL/perovskite interface. We demonstrated that the halogen group at the ETL layer could stabilize the geometric structure of the perovskite surface by balancing the interfacial interaction, ionic migration, and lead iodide framework. Even though halogen passivati… Show more

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Cited by 4 publications
(2 citation statements)
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“…32,33 Most of the electron transport exists between the Pb-I framework and TiO 2 , and MA atomic groups basically do not participate in the electron transport between the interfaces. [34][35][36] Ti forms a chemical bond with I in MAPbI 3 , and electrons are transported from the surface of MAPbI 3 to TiO 2 . [37][38][39][40] The Fermi energy level is at the top of the valence band, and the right side of the Fermi energy level, which is the bottom CBM of SnO 2 , is basically composed of the valence electrons of Sn atoms, while the bottom CBM of MAPbI 3 is mainly the valence electrons of Pb atoms, as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…32,33 Most of the electron transport exists between the Pb-I framework and TiO 2 , and MA atomic groups basically do not participate in the electron transport between the interfaces. [34][35][36] Ti forms a chemical bond with I in MAPbI 3 , and electrons are transported from the surface of MAPbI 3 to TiO 2 . [37][38][39][40] The Fermi energy level is at the top of the valence band, and the right side of the Fermi energy level, which is the bottom CBM of SnO 2 , is basically composed of the valence electrons of Sn atoms, while the bottom CBM of MAPbI 3 is mainly the valence electrons of Pb atoms, as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Moreover, in halide perovskite-based devices, the electron/hole transport layers (TLs) are important components and the TRPL characterization is helpful to evaluate the layer information, i.e., surface/interface impurities and charge carrier transport rate between different layers. [41][42][43] 3. Exponential based models…”
Section: Carrier Lifetime and Spectral Techniquementioning
confidence: 99%