2016
DOI: 10.21122/2220-9506-2016-7-3-312-321
|View full text |Cite
|
Sign up to set email alerts
|

Impedance Spectroscopy of Polycrystalline Tin Dioxide Films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
1
0
2

Year Published

2018
2018
2022
2022

Publication Types

Select...
5
1
1

Relationship

1
6

Authors

Journals

citations
Cited by 7 publications
(3 citation statements)
references
References 1 publication
0
1
0
2
Order By: Relevance
“…Thus, as a result of the analysis of the XRD spectra of the SnO/SnO 2−δ /SnO 2 samples, we can conclude: i) tin oxide films of a variable stoichiometric composition with a predominant tin monoxide phase were fabricated by means of DC magnetron sputtering in the argon plasma followed by a 2-stage annealing process; ii) reactive magnetron sputtering with a small content of oxygen (about 1 vol.%) in the argon-oxygen plasma leads to the preferable formation of more thermodynamically stable tin dioxide nanocrystalline films with a tetragonal rutile-type crystalline structure; iii) increasing of oxygen content during the process of reactive magnetron sputtering up to the value of about 2 vol.% induces the formation of amorhous tin oxide films after following a heat treatment procedure regardless of the annealing temperature. It should be noted that the crystalline structure of tin oxide films with a different stoichiometric composition can be improved by means of additional high-temperature annealing in vacuum or inert atmosphere [22].…”
Section: Resultsmentioning
confidence: 99%
“…Thus, as a result of the analysis of the XRD spectra of the SnO/SnO 2−δ /SnO 2 samples, we can conclude: i) tin oxide films of a variable stoichiometric composition with a predominant tin monoxide phase were fabricated by means of DC magnetron sputtering in the argon plasma followed by a 2-stage annealing process; ii) reactive magnetron sputtering with a small content of oxygen (about 1 vol.%) in the argon-oxygen plasma leads to the preferable formation of more thermodynamically stable tin dioxide nanocrystalline films with a tetragonal rutile-type crystalline structure; iii) increasing of oxygen content during the process of reactive magnetron sputtering up to the value of about 2 vol.% induces the formation of amorhous tin oxide films after following a heat treatment procedure regardless of the annealing temperature. It should be noted that the crystalline structure of tin oxide films with a different stoichiometric composition can be improved by means of additional high-temperature annealing in vacuum or inert atmosphere [22].…”
Section: Resultsmentioning
confidence: 99%
“…Востребованность метода импедансной спектроскопии в последние десятилетия возросла в связи с возросшим уровнем технического и программного обеспечения метода, что позволило сократить временные затраты на получение и обработку экспериментальных данных. За счет проведения измерений на переменном токе импедансная спектроскопия позволяет исследовать механизмы переноса заряда как на фазовой границе раздела двух сред, так и в объеме пленки, выявить происходящие на поверхности полупроводника физико-химические процессы, а за счет варьирования в широком диапазоне частот переменного сигнала наблюдать процессы, протекающие с разными скоростями [13][14][15][16][17][18][19][20].…”
Section: Introductionunclassified
“…Также на рентгеновских спектрах присутствуют пики, характерные для рассеяния на плоскостях (200), (211) и (112) SnO 2 тетрагональной структуры типа рутила [20]. Средний размер кристаллитов SnO 2 оценивался из соотношения Дебая -Шеррера [21]:…”
unclassified