Implementation of a BIC monitor in a new analog BIST structure

Sidiropulos, M.; Stopjaková, Viera; Manhaeve, H.

doi:10.1109/iddq.1996.557817

Cited by 9 publications

(4 citation statements)

References 9 publications

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“…P(TE) may be improved when performance specifications, rather than structural faults, is used in the evaluation, though this may lead to passing of several circuits with structural faults, but that still meet performance specifications. This result may be further refined by augmenting OBT or OBIST measurements with other tests, such as IDDQ measurements [62], [63]. P(YL) can be improved by increasing the CI over which the thresholds are selected.…”

Section: Resultsmentioning

confidence: 99%

Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers

Nel

Dualibe

Stander

2023

IEEE Open J. Circuits Syst.

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Oscillation-based testing (OBT) and Oscillation-based built-in self-testing (OBIST) circuits enable detection of catastrophic faults in analogue and RF circuits, but both are sensitive to process, voltage and temperature (PVT) variation. This paper investigates 15 OBT and OBIST feature extraction strategies, and four approaches to threshold selection, by calculating figure-of-merit (FoM) across PVT variation. This is done using a 2.4 GHz LNA in 0.35 μm CMOS as DUT. Of the 15 feature extraction approaches, the OBT approaches are found more effective, with some benefit gained from switched-state detection. Of the four approaches to threshold selection (nominal-ranged static thresholds, extreme-range static thresholds, temperature dynamic thresholds, and simple noise-filtered tone detection), dynamic thresholds resulted in the highest average FoM of 0.919, with the best FoM of 0.952, with a corresponding probability of test escape P(TE) and yield loss P(YL) of 5•10 -2 and 1.89•10 -2 respectively but requires accurate temperature measurement. Extreme static threshold selection resulted in a comparable average FoM of 0.912, but with less susceptibility to process variation and without the need for temperature measurement. Binary detection of a noisefiltered oscillating tone is found the least complex approach, with an average FoM of 0.891.

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Section: Resultsmentioning

confidence: 99%

Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers

Nel

Dualibe

Stander

2023

IEEE Open J. Circuits Syst.

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“…A generalized theory of current signature analysis and its extension to transient supply current monitoring is described in [21]. Finally, [22] presents a built-in architecture for on line monitoring of quiescent and transient supply currents, while [23] demonstrates a similar built-in implementation for analog structures.…”

Section: Current Signatures In Testingmentioning

confidence: 99%

Testing RF Components with Supply Current Signatures

Akbay

Sen

Chatterjee

2007

16th Asian Test Symposium (ATS 2007)

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We propose a technique for low-cost testing of radio-frequency components integrating current signatures and alternate test methodology. The technique is suitable for non-invasive built-in test as well as low-cost automated test equipment (ATE) applications. Main features of the technique are (1) minimum loading on signal path by sampling supply current, (2) flexible test stimulus generation based on system constraints, (3) test time reduction by using a single test stimulus and data acquisition, and (4) accurate prediction of all specification values from the single excitation. Two experiments using the proposed implementation demonstrate the accuracy and efficiency of the technique on both single-balanced and double-balanced mixers built with two different technologies.

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“…Its operation is based on the conversion of a voltage drop proportional to the quiescent current into a digital word. In [32] a differential built-in current monitor for analog circuits is presented.…”

Section: Introductionmentioning

confidence: 99%