2011
DOI: 10.1088/0963-0252/20/3/035013
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Implicit and electrostatic particle-in-cell/Monte Carlo model in two-dimensional and axisymmetric geometry: II. Self-bias voltage effects in capacitively coupled plasmas

Abstract: With an implicit Particle-in-cell/Monte Carlo model, capacitively coupled plasmas are studied in two-dimensional and axisymmetric geometry. Self-bias dc voltage effects are self-consistently considered. Due to finite length effects,the self-bias dc voltages show sophisticating relations with the electrode areas. Two-dimensional kinetic effects are also illuminated. Compare to the fluid mode, PIC/MC model is numerical-diffusion-free and thus finer properties of the plasmas are simulated.

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Cited by 61 publications
(53 citation statements)
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“…We make use of our implicit Particle‐in‐cell/Monte Carlo collision (PIC/MCC) method (1D3V) to investigate the MAE on a single‐frequency rf source excited and geometrically symmetric CCP. This method has been described in detail and widely tested before . The self‐bias voltage is determined in the simulation in an iterative way to ensure that the net current to the two electrodes per one rf cycle is zero.…”
Section: Pic/mcc Modelmentioning
confidence: 99%
“…We make use of our implicit Particle‐in‐cell/Monte Carlo collision (PIC/MCC) method (1D3V) to investigate the MAE on a single‐frequency rf source excited and geometrically symmetric CCP. This method has been described in detail and widely tested before . The self‐bias voltage is determined in the simulation in an iterative way to ensure that the net current to the two electrodes per one rf cycle is zero.…”
Section: Pic/mcc Modelmentioning
confidence: 99%
“…An explicit PIC model is computationally intensive, since it requires to resolve the Debye length and the electron oscillation frequency, which requires much smaller space and time steps, leading to high computational cost. The alternative approach is to use an implicit PIC model, where much larger space and time steps are allowed with reasonable accuracy. Therefore, in this paper, we use a one‐dimensional implicit and electrostatic PIC/MCC method to investigate the operating effect of an external EB in a rf argon discharge.…”
Section: Physical and Numerical Modelmentioning
confidence: 99%
“…The alternative approach is to use an implicit PIC model, where much larger space and time steps are allowed with reasonable accuracy. Therefore, in this paper, we use a one‐dimensional implicit and electrostatic PIC/MCC method to investigate the operating effect of an external EB in a rf argon discharge. Here we have used a direct implicit PIC/MCC simulation code, which has five steps: (1) pre‐pushing the particle velocity from the previous electric field; (2) charge weighting from the positions of all species particles; (3) obtaining the electric field by solving the Poisson equation with direct summation and extrapolation of the charge density; (4) post‐pushing the particle velocity by using the new electric field; and (5) MCC process.…”
Section: Physical and Numerical Modelmentioning
confidence: 99%
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“…Here we use a one-dimensional (1D) direct implicit method, in which the field equations are derived from direct summation and extrapolation of the equations of particle motion. Our method has been described in detail and tested widely before [22]. Generally, the implicit method is numerically stable over the spatial steps, but the spatial steps will limit the spatial resolution.…”
Section: Description Of the Modelmentioning
confidence: 99%