2006
DOI: 10.1016/j.jcrysgro.2005.10.027
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Improved structure and performance of the GaAsSb/InP interface in a resonant tunneling diode

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Cited by 6 publications
(8 citation statements)
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References 17 publications
(19 reference statements)
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“…The peak at 4.2 eV in the GaAsSb reference spectrum was also observed in both spectra, but shifted to 3.8 eV. In all cases the LEED patterns showed a clear cð4 Â 4Þ reconstruction as it was expected for the Asrich GaAsSb surface [14]. In Fig.…”
Section: Growth Of Gaassb On Different Surface Reconstructions Of Ingaassupporting
confidence: 70%
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“…The peak at 4.2 eV in the GaAsSb reference spectrum was also observed in both spectra, but shifted to 3.8 eV. In all cases the LEED patterns showed a clear cð4 Â 4Þ reconstruction as it was expected for the Asrich GaAsSb surface [14]. In Fig.…”
Section: Growth Of Gaassb On Different Surface Reconstructions Of Ingaassupporting
confidence: 70%
“…Both GaAsSb surfaces were As-terminated. Even for the Sb-terminated GaAsSb surface grown on Asrich InGaAs the Sb to As ratio was lower than for the standard As-rich GaAsSb [14], grown on III-rich InGaAs.…”
Section: Growth Of Gaassb On Different Surface Reconstructions Of Ingaasmentioning
confidence: 72%
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