Improvements in the direct analysis of advanced materials using ICP-based measurement techniques

Abstract

The analysis of advanced materials using ICP-based solid sampling approaches offers many advantages and possibilities. Recent developments are discussed in this review..

Quantitative analysis of gadolinium doped cerium oxide thin films via online-LASIL-ICP-OES

“…Basically there are two main routes that can be followed: (i) transformation of the solid material into a liquid and subsequent analysis or (ii) the use of solid sampling techniques. 5 In the following, the possible analysis techniqueswithout any claim to completenessshall be mentioned: for elemental analysis of liquids, atomic absorption spectroscopy (AAS), inductively coupled plasma-optical emission spectroscopy (ICP-OES), and inductively coupled plasma-mass spectrometry (ICP-MS) are widely used techniques with excellent precision and accuracy. In the eld of solid sampling there is a great variety of techniques starting with X-ray based methods, such as X-ray photo electron spectroscopy (XPS) and energy dispersive X-ray microanalysis (SEM-EDX), leading to secondary ion mass spectrometry (SIMS), glow discharge-mass spectrometry (GD-MS), and laser ablation inductively coupled plasma-mass spectrometry (LA-ICP-MS).…”

Single shot laser ablation MC-ICP-MS for depth profile analysis of U isotopes in UO2 single crystals

“…1 Nowadays, the accurate and precise determination of the elemental and/or isotopic composition of advanced crystalline materials is of utmost importance to guarantee their properties and to identify potential contaminants. [2][3][4][5][6][7][8][9][10][11][12] Classical analytical approaches employing dissolution of a fragment of such materials followed by subsequent chemical analysis are not effective because their features are captured either in thin (nm to mm thick) layers or within local hot spots. Therefore, solid sampling techniques such as Electro-Thermal Vaporisation (ETV) or Laser Ablation (LA) are employed frequently for this purpose.…”

“…Therefore, solid sampling techniques such as Electro-Thermal Vaporisation (ETV) or Laser Ablation (LA) are employed frequently for this purpose. 7 LA-based techniques additionally offer easy access to spatially resolved information on the elemental/isotopic composition of the investigated material.…”

“…While the use of other surface analytical techniques such as secondary ion mass spectrometry (SIMS), glow discharge-mass spectrometry (GD-MS), X-ray photoelectron spectroscopy (XPS) or transmission electron microscopy (TEM) may also be advantageous within this context, LA combined with ICP-MS has found widespread use during the last decade. 7 The bene-ts of LA-ICP-MS include easy manipulation of samples under atmospheric pressure as well as providing both high spatial resolution and high sensitivity because specimens are analysed directly. 7 The lateral resolution of a few mm enables identifying potential inhomogeneity within a sample, with extended line scan analysis providing results reecting bulk analysis.…”

“…7 The bene-ts of LA-ICP-MS include easy manipulation of samples under atmospheric pressure as well as providing both high spatial resolution and high sensitivity because specimens are analysed directly. 7 The lateral resolution of a few mm enables identifying potential inhomogeneity within a sample, with extended line scan analysis providing results reecting bulk analysis. 11,12 In addition, depth proling capabilities of LA provide sub-mm depth resolution.…”