Improving the lateral resolution of the MFM technique to the range

Koblischka, Michael Rudolf; Hartmann, Uwe; Sulzbach, T.

doi:10.1016/j.jmmm.2004.01.030

Cited by 39 publications

(24 citation statements)

References 17 publications

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“…5(b) indicate the out-of-plane magnetization in domain walls. However, due to the fact that the width of domain walls is of the order of 10 nm and the resolution of MFM technique is roughly of the order of lift scan height (∼100 nm), 50 the stray field generated by domain walls can hardly be resolved by MFM experimentally. OOMMF simulations reproduce the experimentally observed MFM images.…”

Section: Resultsmentioning

confidence: 99%

Periodic magnetic domains in single-crystalline cobalt filament arrays

et al. 2016

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Magnetic structures with controlled domain wall pattern may be applied as potential building blocks for three-dimensional magnetic memory and logic devices. Using a unique electrochemical self-assembly method, we achieve regular single-crystalline cobalt filament arrays with specific geometric profile and crystallographic orientation, and the magnetic domain configuration can be conveniently tailored. We report for the first time the transition of periodic anti-parallel magnetic domains to a compressed vortex magnetic domains depending on the ratio of height vs. width of the wires. A "phase diagram" is obtained to describe the dependence of the type of magnetic domains and the geometrical profiles of the wires. Magnetoresistance of the filaments demonstrates that the contribution of series of 180 o domain walls is over 0.15% of the zero-field resistance ρ(H = 0). These self-assembled magnetic nanofilaments, with controlled periodic domain patterns, offer an interesting platform to explore domain-wall-based memory and logic devices.

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Section: Resultsmentioning

confidence: 99%

Periodic magnetic domains in single-crystalline cobalt filament arrays

et al. 2016

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“…As a starting point for the advanced MFM tips, mic ro-machined silicon cantilevers (Nanoworld Services, 2-3 Nm −1 , resonance frequency f res ≈ 60-70 kHz)were employed Koblischka et al ., 2004;Nanoworld, 2006). Originally, advanced MFM cantilevers based on these tips were prepared using the EBD technique (Wadas et al ., 1994;Hartmann, 1999; yielding a high-aspect-ratio, needle-type tip.…”

Section: Advanced Tips For Magnetic Force Microscopymentioning

confidence: 99%

Advanced Cantilevers for Magnetic Force Microscopy and High Frequency Magnetic Force Microscopy

et al. 2008

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In order to improve the spatial resolution achieved by magnetic force microscopy (MFM) technique and its derivatives, we employ here advanced MFM tips fabricated by means of focused ion beam (FIB) milling. The magnetic coating applied on these tips is a CoCr film of 10 nm thickness. The MFM measurements on hard disk test samples reveal the achieved high resolution, and the measurement on a garnet film demonstrates the low invasiveness. High-frequency MFM (HF-MFM) is a development of the MFM technique to observe the HF stray fields emerging from magnetic recording writer poles at their operating conditions. By means of HF-MFM, magnetic recording writer poles are characterized in the frequency range 100-1,000 MHz. Up to now, all HF-MFM experiments conducted were using standard MFM cantilevers. From the HF-MFM images obtained using the advanced MFM cantilevers, it is clearly seen that the spatial resolution is considerably improved over the images obtained using standard MFM tips. However, the 10 nm thick magnetic coating of the cantilevers is found to work properly only at frequencies of up to about 500 MHz.

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“…The resolution and sensitivity depend largely on the geometry and magnetic This work was supported in part by ODDR&E MURI01 DAAD19-01-1-0465 to Boston University and the Center for Networked Communicating Control Systems, by NSF ITR Program DMI-0330171, and by NSF DBI-0649823 D. Baronov properties of the probe. Resolution on the order of 100 nm is easily achievable [6] and recent results have yielded a resolution as fine as 10 nm [7], [8]. The technique is easy to perform and can be operated in a variety of physical environments, including in liquid.…”

Section: Introductionmentioning

confidence: 99%

Tracking a nanosize magnetic particle using a magnetic force microscope

Baronov

Andersson

Baillieul

2007

2007 46th IEEE Conference on Decision and Control

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A scheme for tracking nano-sized magnetic particles using a magnetic force microscope (MFM) is introduced. The stray magnetic field of the particle induces a shift in the phase of the oscillation of the MFM tip. The magnitude of this shift depends on the distance between the tip and the particle and can be expressed as a spatial field. We present a control law which steers the tip to a level set of this field. The approach is based on the previous work of two of the authors on a novel method for mapping unknown potential fields using sensorenabled mobile robots. Because the method involves geometric properties of the field and its domain, it is not surprising that it can be applied to problems where the characteristic length scales are small. Additionally, we introduce to the original control law an adaptive term to compensate for uncertainties in the parameter values in the model of the magnetic force. The efficacy of this approach is illustrated through simulation. This approach to tracking will provide the capability to investigate the dynamics of single molecules with a higher resolution (in both space and time) than is currently possible.

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Improving the lateral resolution of the MFM technique to the range

Cited by 39 publications

References 17 publications

Periodic magnetic domains in single-crystalline cobalt filament arrays

Periodic magnetic domains in single-crystalline cobalt filament arrays

Advanced Cantilevers for Magnetic Force Microscopy and High Frequency Magnetic Force Microscopy

Tracking a nanosize magnetic particle using a magnetic force microscope

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