In-air micro-PIXE chemical state analysis of phosphorus and sulfur using a new parallel-beam wavelength-dispersive X-ray emission spectrometer

Kavčič, Matjaž

doi:10.1016/j.sab.2024.106926

Spectrochimica Acta Part B: Atomic Spectroscopy

2024

DOI: 10.1016/j.sab.2024.106926

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In-air micro-PIXE chemical state analysis of phosphorus and sulfur using a new parallel-beam wavelength-dispersive X-ray emission spectrometer

Matjaž Kavčič

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Upgrade of the ion beam analysis end-station with the wavelength dispersive X-ray spectrometer for use with the focused MeV ion beams

Božičević Mihalić,

Mioković,

Rodriguez Ramos

et al. 2024

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Upgrade of the ion beam analysis end-station with the wavelength dispersive X-ray spectrometer for use with the focused MeV ion beams

Božičević Mihalić,

Mioković,

Rodriguez Ramos

et al. 2024

Measurement

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In-air micro-PIXE chemical state analysis of phosphorus and sulfur using a new parallel-beam wavelength-dispersive X-ray emission spectrometer

Cited by 1 publication

References 33 publications

Upgrade of the ion beam analysis end-station with the wavelength dispersive X-ray spectrometer for use with the focused MeV ion beams

Upgrade of the ion beam analysis end-station with the wavelength dispersive X-ray spectrometer for use with the focused MeV ion beams

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