2002
DOI: 10.1016/s0168-583x(01)01199-5
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In-depth concentration distribution of Ar in Si surface after low-energy Ar+ ion sputtering

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Cited by 17 publications
(12 citation statements)
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“…A recent study suggests that a 500 V argon ion beam caused relocations of atoms in SiO 2 and Si at depths of >5 nm. 13 It might imply that even a 500 V argon ion beam could damage material as deep as the information depth for XPS.…”
Section: Contaminated Ptfementioning
confidence: 99%
“…A recent study suggests that a 500 V argon ion beam caused relocations of atoms in SiO 2 and Si at depths of >5 nm. 13 It might imply that even a 500 V argon ion beam could damage material as deep as the information depth for XPS.…”
Section: Contaminated Ptfementioning
confidence: 99%
“…4,5 A depth resolution of ¾1.8 nm was also reported by Shimizu and Inoue for sputter depth profiling of the GaAs/AlAs superlattice using 150-eV Ar C ions. 6 In addition to these studies, which mainly focused on the depth resolution itself, several studies dealing with the measurement of the thickness of the mixing layer by means of medium-energy ion scattering 7,8 and transmission electron microscopy (TEM) 9 -13 have also been reported. Those studies also revealed that the application of low-energy ions is effective in high-depth-resolution sputter depth profiling.…”
Section: Introductionmentioning
confidence: 99%
“…With respect to the effect of the mixing layer, several studies have been performed by means of mediumenergy ion spectroscopy (MEIS) 7,8 and transmission electron microscopy (TEM). 9 -11 These results revealed that lowenergy ion irradiation at glancing incidence is effective for reduction of the mixing layer thickness.…”
Section: Introductionmentioning
confidence: 99%