“…ror models 4 ⃝ based on a previous understanding of DRAM errors (e.g., from past experiments or scientific studies). Examples of such error models include: analytical models based on understanding DRAM failure modes (e.g., sources of runtime faults [51,60,149,[371][372][373]), parametric statistical models that provide useful summary statistics (e.g., lognormal distribution of cell data-retention times [276,277,[374][375][376][377][378][379][380], exponential distribution of the time-in-state of cells susceptible to variable-retention time (VRT) [65,94,150,166,367,[381][382][383][384][385][386][387][388][389]), physics-based simulation models (e.g., TCAD [232,374,[390][391][392] and SPICE models [14,59,78,106,109,283,[393][394][395]), and empirically-determined curves that predict observations well (e.g., single-bit error rates…”