2014
DOI: 10.1021/am500363t
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In Situ Atomic Force Microscopy Study of Initial Solid Electrolyte Interphase Formation on Silicon Electrodes for Li-Ion Batteries

Abstract: Precise in situ atomic force microscopy (AFM) is used to monitor the formation of the solid electrolyte interphase (SEI) on Si electrodes. The stability of these passivation films on negative electrodes is critically important in rechargeable Li-ion batteries, and high capacity materials such as Si present substantial challenges because of the large volume changes that occur with Li insertion and removal. The results reported here show that the initial rapid SEI formation can be stabilized before significant L… Show more

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Cited by 125 publications
(167 citation statements)
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“…2016, 6, 1501768 www.MaterialsViews.com www.advenergymat.de wileyonlinelibrary.com At fi rst sight, the large values of SEI thickness might appear surprising (they reach or even overcome the thickness of the pristine electrode). [ 77 ] Therefore, the estimated SEI thickness found on our a-Si:H electrodes are indeed expected to exceed typical values assumed for the SEI layer on carbon electrodes. As a matter of fact, in agreement with the literature, [ 74 ] it has been verifi ed (by in situ optical microscopy, ex situ SEM, and from the analysis of TOF-SIMS profi les) that our 30 nm thick layers do not exhibit cracks upon lithiation/delithiation.…”
Section: Sei Evolutionmentioning
confidence: 63%
“…2016, 6, 1501768 www.MaterialsViews.com www.advenergymat.de wileyonlinelibrary.com At fi rst sight, the large values of SEI thickness might appear surprising (they reach or even overcome the thickness of the pristine electrode). [ 77 ] Therefore, the estimated SEI thickness found on our a-Si:H electrodes are indeed expected to exceed typical values assumed for the SEI layer on carbon electrodes. As a matter of fact, in agreement with the literature, [ 74 ] it has been verifi ed (by in situ optical microscopy, ex situ SEM, and from the analysis of TOF-SIMS profi les) that our 30 nm thick layers do not exhibit cracks upon lithiation/delithiation.…”
Section: Sei Evolutionmentioning
confidence: 63%
“…This interpretation is consistent with earlier statements claiming that SEI grows mainly during the initial formation cathodic scan. 10,11,35 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 insets. 38 The related distribution of the apparent Young's modulus of the SEI as determined by 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 Nanoindentation measurements were conducted with sharp AFM tips and spherical colloidal probes (CPs) on the SEI formed after the first...…”
Section: Electrochemical Formation and Morphological Characterizationmentioning
confidence: 99%
“…The SEI layer does not have mechanical tolerance to endure the large volumetric changes during expansion/contraction of the silicon surface. [8][9][10][11][12][13][14] As a result, the electrolyte decomposes continuously to cover newly exposed surface and increase the thickness of the SEI. In addition to the problems due to the large volume changes, low conductivity of silicon and structural stress owing to phase transformation have also been reported to contribute to capacity fading.…”
mentioning
confidence: 99%