2004
DOI: 10.1016/s0955-2219(03)00583-1
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In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements

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Cited by 21 publications
(14 citation statements)
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“…For submicron size ferroelectric capacitors, the capacitance is usually one or two orders of Technol (2012) 18:531-535 533 magnitude lower than the parasitic capacitance of the whole set-up including the probe. And thus it will cause very high polarization values in the saturation regime (Schmitza et al 2004). Furthermore, for nano-scale capacitors, significant displacement of 90°domains during the application of the electric field would lead to the increase of the remanent polarization (Alexe and Gruverman 2004), which is consistent with our measurement results.…”
Section: Resultssupporting
confidence: 88%
“…For submicron size ferroelectric capacitors, the capacitance is usually one or two orders of Technol (2012) 18:531-535 533 magnitude lower than the parasitic capacitance of the whole set-up including the probe. And thus it will cause very high polarization values in the saturation regime (Schmitza et al 2004). Furthermore, for nano-scale capacitors, significant displacement of 90°domains during the application of the electric field would lead to the increase of the remanent polarization (Alexe and Gruverman 2004), which is consistent with our measurement results.…”
Section: Resultssupporting
confidence: 88%
“…Owing to the influence of the parasitic capacitance, the tested remanent polarization and coercive field can increase remarkably, and with a reduction in the sizes of cells, this kind of phenomena will become more remarkable. This is in agreement with research results that "the parasitic capacitance should be one to two orders larger than capacitor of cells" obtained by Schmitz et al [9] ; and the existence of leakage current can also enlarge the testing results. Alexe et al [10] held that the effect of leakage current upon the remanent polarization and coercive field in saturated state should be of the same extent as the effect of parasitic capacitance upon the testing results, which can also render the testing results to increase remarkably.…”
Section: Ferroelectric Performances Of Array Dots Of Pzt Filmssupporting
confidence: 93%
“…8,9 As the switching charge to detect drops below the background noise for ever shrinking structure dimensions, the smallest capacitors ever electrically characterized were 200ϫ 200 nm 2 . 10,11 In order to enable electrical characterization on nanoscale ferroelectric capacitors and to set a step toward further integration, our group recently presented self-assembled lead titanate ͓PbTiO 3 ͑PTO͔͒ nanograins embedded in a layer of low-k dielectric spin-on glass ͑SOG͒ and equipped with collective gold top electrodes. 12 Electrical access to the grain tops was provided using a dedicated chemical mechanical polishing ͑CMP͒ step.…”
Section: Introductionmentioning
confidence: 99%