In situ EBSD Studies of Blocky Grain Growth in Welded Zircaloy-4

Birch, Ruth; Britton, T. Ben

doi:10.1017/s1431927622002872

Cited by 1 publication

(2 citation statements)

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“…Modifying the sample rotation angle β with respect to the stage holder is another overall rotation method. The EBSD data sets (D) of a fine-grained Zircaloy-4 shared by Birch and Britton [47] shown in figure 9(d)-(f). The rotations of β are visible by comparing the 3 EBSPs.…”

Section: Acquisitions With Different Rotation Angles βmentioning

confidence: 99%

“…The Ni EBSD data set of medium quality is available at Zenodo [51] (DOI: https://doi.org/10.5281/zenodo.7937129), while the Ni EBSD data set of fast acquisition was shared by Jackson et al [41]. The Zircalloy EBSD data sets of different sample positioning are shared by Birch & Britton at Zenodo [47] (DOI: https://doi.org/10.5281/zenodo.4925663). The indexation results for all these data are also provided, including the crystal orientations and calibrated PC coordinates, with the full pattern or its gradient norms, with the floating PC coordinates or the filtered ones.…”

Section: Data Availability Statementmentioning

confidence: 99%

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Accuracy assessment of crystal orientation indexations by EBSD

Shi,

Loisnard,

et al. 2024

Meas. Sci. Technol.

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Accuracy and uncertainty analyses are essential for every measurement technology. In crystal orientation indexation by electron backscatter diffraction (EBSD), a series of accuracy estimations have been made for the Hough transform and dictionary indexation methods. The mean angular deviation is a standard parameter to indicate orientation accuracy, but this criterion is indirect and closely related to the accuracy of the projection center coordinates. Precise known orientation relationships are necessary to evaluate orientation accuracy without the ground truth. The current work uses the natural crystal twins and hardware orientation relationships to assess the orientation accuracy directly. The accuracy level for different EBSD analysis methods is compared through four experimental data sets of varying pattern definitions and noise levels. It is found that the full pattern match (FPM) algorithms improve the accuracy as compared to Hough indexation, and the gain varies greatly between 14% for fast acquisitions and 20 times for high-quality patterns. Depending on the resolution and quality of diffraction patterns, FPM results in an accuracy of crystal orientation between 0.04° and 0.9°. Comparing the two FPM variants, matching the gradients of diffraction patterns performs better in the case of high-to-median quality acquisitions while matching the pattern itself is more accurate for more noisy and low-definition patterns.

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Section: Acquisitions With Different Rotation Angles βmentioning

confidence: 99%