2021
DOI: 10.3390/cryst11020158
|View full text |Cite
|
Sign up to set email alerts
|

In Situ Investigations on Stress and Microstructure Evolution in Polycrystalline Ti(C,N)/α-Al2O3 CVD Coatings under Thermal Cycling Loads

Abstract: The stress behavior and the associated microstructure evolution of industrial Ti(C,N)/α-Al2O3 coatings subjected to thermal cycling are investigated by in situ energy dispersive synchrotron X-ray diffraction and transmission electron microscopy. Temperature-dependent stresses and changes in microstructural parameters (domain size and microstrain) are analyzed by in situ measurements at different temperatures between 25 and 800 °C, both in the heating up and cooling down step, including several thermal cycles. … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
7
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 10 publications
(7 citation statements)
references
References 42 publications
0
7
0
Order By: Relevance
“…Stress analysis on the investigated layers was performed for the diffraction lines summarized in Table 2 and the average of the resulting stress values was taken to monitor the stress evolution during thermal cycling. Further details about instrumentation and method have been extensively reported in a previous work by the authors [13]. [20,21] using the respective single crystal elastic constants.…”
Section: Methodsmentioning
confidence: 99%
See 4 more Smart Citations
“…Stress analysis on the investigated layers was performed for the diffraction lines summarized in Table 2 and the average of the resulting stress values was taken to monitor the stress evolution during thermal cycling. Further details about instrumentation and method have been extensively reported in a previous work by the authors [13]. [20,21] using the respective single crystal elastic constants.…”
Section: Methodsmentioning
confidence: 99%
“…Transmission Electron Microscopy (TEM) observations were done using a doublecorrected Thermo-Fisher-Scientific Titan G2 microscope operated at 300 KV. Dark field scanning TEM (STEM) images were taken at a camera distance of 73 mm from crystal grains tilted into low-index-zone axes to observe crystalline defects on the α-Al 2 O 3 top layer, as described in [13].…”
Section: Componentmentioning
confidence: 99%
See 3 more Smart Citations