2020
DOI: 10.1080/17686733.2020.1829889
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In-situ monitoring of a laser metal deposition (LMD) process: comparison of MWIR, SWIR and high-speed NIR thermography

Abstract: Additive manufacturing offers a range of novel applications. However, the manufacturing process is complex and the production of almost defect-free parts with high reliability and durability is still a challenge. Thermography is a valuable tool for process surveillance, especially in metal additive manufacturing processes. The high process temperatures allow one to use cameras usually operating in the visible spectral range. Here, we compare the results of measurements during the manufacturing process of a com… Show more

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Cited by 49 publications
(23 citation statements)
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“…This was in good agreement with the visually noticeable tempering colors and the literature review. For example, apparent emissivity values of 0.58 were determined using the same camera in the laser metal deposition of AISI 316L, where stronger oxidation is expected to occur due to a less efficient shielding of oxygen by a local shielding gas flow in surrounding air conditions [34].…”
Section: Oxidation Effects On the Apparent Emissivity Of The 316l L-pbf Surfacementioning
confidence: 99%
“…This was in good agreement with the visually noticeable tempering colors and the literature review. For example, apparent emissivity values of 0.58 were determined using the same camera in the laser metal deposition of AISI 316L, where stronger oxidation is expected to occur due to a less efficient shielding of oxygen by a local shielding gas flow in surrounding air conditions [34].…”
Section: Oxidation Effects On the Apparent Emissivity Of The 316l L-pbf Surfacementioning
confidence: 99%
“…The accuracy of determining the surface temperature is limited by the unknown emissivity ε . In addition, emissivity can change during additive manufacturing (AM), as it depends on material, temperature, viewing angle, surface roughness, and presence of oxide films [ 17 , 18 ]. As a consequence, the instrument-calibration process is extremely difficult.…”
Section: Introductionmentioning
confidence: 99%
“…In order to correctly assess temperature distribution on the housing of electronic components, it is necessary to take into account all factors that can influence the measurement [ 6 , 7 , 8 ]. The most important of them include the value of the emissivity coefficient ε [ 9 ], the reflected temperature ϑ r [ 10 ], the distance between the lens and the observed object d [ 11 ], the ambient temperature ϑ a [ 12 ], the temperature of the external optical system [ 13 ], the transmittance of the external optical system [ 14 , 15 ], the relative humidity ω [ 16 ], the viewing angle β [ 7 ], and the sharpness of the recorded thermogram [ 17 , 18 , 19 ]. An assessment of the influence of the abovementioned factors on the accuracy of the thermographic temperature measurement of small-sized electronic components is possible thanks to the use of a microscopic thermography stand.…”
Section: Introductionmentioning
confidence: 99%