“…testing system. Since that time, numerous studies have demonstrated that in-situ fatigue in the SEM device is an effective tool for the investigation of microstructural effects on the development of slip features [12,13], on crack initiation [2,5,[14][15][16][17][18][19], for the analysis of the mechanisms of crack growth [14][15][16][17]20,21], for the quantitative determination of small crack growth rates [14][15][16][17][18]22], crack tip opening displacements [16,[23][24][25], for the examination of interactions between fatigue crack growth and microstructure [15,16,[26][27][28], for the effects of vacuum, high temperature, water vapor environments, notch and pores alignment etc. [6,15,16,[29][30][31].…”