2007
DOI: 10.1016/j.diamond.2006.12.036
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In situ study of the initial stages of diamond deposition on 3C–SiC (100) surfaces: Towards the mechanisms of diamond nucleation

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Cited by 22 publications
(14 citation statements)
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“…12 Two different bias voltages, −180 and −290 V, were applied for 10 and 9 min, respectively ͑Table I͒. First, each reconstructed 3C-SiC substrate was exposed to a microwave plasma discharge using a CH 4 /H 2 ͑3 vol % ͒ gas mixture flowing at 250 SCCM ͑SCCM denotes cubic centimeter per minute at STP͒.…”
mentioning
confidence: 99%
“…12 Two different bias voltages, −180 and −290 V, were applied for 10 and 9 min, respectively ͑Table I͒. First, each reconstructed 3C-SiC substrate was exposed to a microwave plasma discharge using a CH 4 /H 2 ͑3 vol % ͒ gas mixture flowing at 250 SCCM ͑SCCM denotes cubic centimeter per minute at STP͒.…”
mentioning
confidence: 99%
“…The less intense peak at 284.8 eV can roughly be assigned to some kind of C–C bond, but the exact origin is unclear . In literature, C 1s peaks occurring at 285.0 ±0.4 eV have been discussed related to various origins, such as diamond‐like sp 3 carbon (285.0 eV), graphitic sp 2 carbon (284.6 eV), adventitious carbon (285.1 eV) from organic post‐fabrication deposites, or mixed sp 2 /sp 3 phases . Estrade‐Szwarckopf investigated asymmetric C 1s features, where a broad peak occurred, shifted against the graphitic sp 2 peak with its intensity varying with the treatment of the sample and referred to this broad 285 eV peak as “defect carbon” .…”
Section: Resultsmentioning
confidence: 99%
“…Under proper BEN conditions, organized nanostructures could be formed at the surface. Perpendicular stripes corresponding to different crystallographic domains were observed after BEN on 3C-SiC surfaces 114,115 Figure 10.9). A surface roughening was also reported on iridium surfaces.…”
Section: Techniques For Diamond Nucleation Enhancementmentioning
confidence: 92%