2010
DOI: 10.1016/j.solmat.2009.10.009
|View full text |Cite
|
Sign up to set email alerts
|

In Situ thickness measurements of chemical bath-deposited CdS

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
11
0

Year Published

2010
2010
2023
2023

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 19 publications
(11 citation statements)
references
References 17 publications
0
11
0
Order By: Relevance
“…The details are shown elsewhere [35]. The CIS was immersed in a 10% KCN solution for 10 min for the removal of secondary CuS phase prior to the cell assembly.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The details are shown elsewhere [35]. The CIS was immersed in a 10% KCN solution for 10 min for the removal of secondary CuS phase prior to the cell assembly.…”
Section: Methodsmentioning
confidence: 99%
“…The CBD process was is carried out at 65°C for 40 min. The details are shown elsewhere [35]. This was followed by the sputter deposition of a ZnO (100 nm thick) and then a AZO (500 nm) layers.…”
Section: Methodsmentioning
confidence: 99%
“…Some studies have been conducted on the fundamental properties of CdS films deposited by an ammonia-free CBD process [247] and very few studies have used an ammoniafree buffer layer for the fabrication of a CIGS solar cell [248]. In a recent work, Mann et al [249] has also deposited CdS by CBD and used optical reflectance-based measurement of the growing film to determine in situ film thickness.…”
Section: International Journal Of Photoenergymentioning
confidence: 99%
“…CdS layers have previously been investigated by other techniques including XPS, X-ray emission spectrosocpy, optical absorption and reflectance techniques. [11][12][13][14][15] Here we use X-ray absorption spectroscopy (XAS); XAS is an element-specific probe of the (partial) unoccupied electronic structure of a material, explored via core-level transitions, governed by the dipole selection rule, from which the atomic structure or chemistry can be inferred. [16] XAS has previously been applied to a wide range of sulfur materials.…”
Section: Introductionmentioning
confidence: 99%