In this report, the
results of gallium nitride (GaN) crystal growth
on a silicon substrate covered by gold nanoparticles (AuNPs) are described
using the chemical vapor deposition (CVD) technique. The formation
of AuNPs by solid-state dewetting and a preferential crystallization
of GaN species on the gold nucleation centers were demonstrated. The
migration and embedding of gold centers during the ripening of GaN
structures were evidenced by scanning electron microscopy (SEM) and
transmission electron microscopy (TEM). Embedded AuNPs endowed the
structural and optical properties of a semiconductor, related to the
particle size, GaN crystallite, and plasmon–exciton interactions.
Photoluminescence (PL) and UV–vis spectroscopy revealed a reduction
in the intensity of the near band emission (NBE) at 3.4 eV in the
gold-nucleated film in addition to a broadening of the absorption
band edge. An increase in the density current of 0.046–0.142
mA/cm2 in a gold-nucleated GaN-based p–n junction
was obtained, attributed to the localized surface plasmon resonance
(LSPR) effects of the embedded AuNPs. Beyond the advantages of applying
group III nitrides in the electronic field, appropriate modification
of the preparation method of these materials with metallic covered
substrates could provide them with specific properties, according
to a targeted application.