2012
DOI: 10.1117/12.925076
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InAs/InAsSb Type-II superlattice: a promising material for mid-wavelength and long-wavelength infrared applications

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Cited by 4 publications
(3 citation statements)
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“…This makes them excellent candidates for use in the active region of MIR LEDs. The majority of research to date has focused on the study of InAs/InAsSb structures grown lattice-matched and therefore unstrained onto GaSb substrates [5,6] comprising numerous thick InAsSb layers of high antimony content, as required for the development of MIR photodetectors [7][8][9][10]. These superlattices have also been quite successful as the active regions in lasers [11][12][13].…”
Section: Introductionmentioning
confidence: 99%
“…This makes them excellent candidates for use in the active region of MIR LEDs. The majority of research to date has focused on the study of InAs/InAsSb structures grown lattice-matched and therefore unstrained onto GaSb substrates [5,6] comprising numerous thick InAsSb layers of high antimony content, as required for the development of MIR photodetectors [7][8][9][10]. These superlattices have also been quite successful as the active regions in lasers [11][12][13].…”
Section: Introductionmentioning
confidence: 99%
“…The 20-arcsec SL zero-order peak FWHM result is compatible with the one of the best results for InAs/Ga(In)Sb SLs reported in the literature. 16,17 Following the structural characterization, PL measurement is performed using a FTIR with the double-modulation technique. The T2SL samples are excited with a 780-nm laser modulated at 50 kHz to discriminate the PL signal from the background blackbody radiation in the MWIR and the LWIR bands.…”
Section: Device Characteristicsmentioning
confidence: 99%
“…The studied InAs/InAsSb T2SL structures cover a wavelength range from 4 μm to 13 μm by tuning the Sb composition in the InAsSb layers and the periodicity of the superlattice. Since the material properties observed in MWIR and LWIR InAs/InAsSb T2SLs are reasonably similar, 16 the performance of the fabricated 13.2 μm device is taken as a reference to estimate the operating temperature and other properties of a typical10.6 μm cut-off nBn device.…”
Section: Introductionmentioning
confidence: 99%