2015
DOI: 10.1016/j.apm.2014.08.006
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Incorporating inflection S-shaped fault reduction factor to enhance software reliability growth

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Cited by 48 publications
(18 citation statements)
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“…Practically, FRF is affected by various factors viz, resource allocation, defect density, fault dependency, environment, time lag in removing faults, learning process, error generation etc. Pachauri, Dhar and Kumar [19] defined FRF as S-shaped function for software released in multiple versions. Several other definitions of FRF were coined by some researchers which did not become much popular in the research community Friedman, Tran and Goddard [20] defined FRF in terms of detectability, associability and fault growth and Malaiya, Von Mayrhauser and Srimani [21] defined FRF in terms of fault exposure ratio.…”
Section: Fig 1 Change Point Representationmentioning
confidence: 99%
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“…Practically, FRF is affected by various factors viz, resource allocation, defect density, fault dependency, environment, time lag in removing faults, learning process, error generation etc. Pachauri, Dhar and Kumar [19] defined FRF as S-shaped function for software released in multiple versions. Several other definitions of FRF were coined by some researchers which did not become much popular in the research community Friedman, Tran and Goddard [20] defined FRF in terms of detectability, associability and fault growth and Malaiya, Von Mayrhauser and Srimani [21] defined FRF in terms of fault exposure ratio.…”
Section: Fig 1 Change Point Representationmentioning
confidence: 99%
“…Among these definitions, Musa's version of FRF became very popular in the research community. After Realizing the importance of FRF in affecting the failure behavior, several NHPP based SRGMs were proposed considering FRF as one of the key component [6,8,9,18,19,48]. These studies also captured the FRF trend.…”
Section: Frfmentioning
confidence: 99%
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“…process [16], [17]. Also some other factors in real developing process are integrated to improve the estimation accuracy of SRGMs, such as testing coverage [18]- [20], testing effort [21]- [25], time-delay fault correction [26]- [29] and fault reduction factor [30]. Most models assume that the operating environment is the same as the testing environment, and the underlying assumption is that the software used in the operating environment has the same failure-occurrence behavior as that used in the software testing environment.…”
Section: Introductionmentioning
confidence: 99%
“…Hsu et al [17] proposed srgm by considering time variable frf that depicts increasing, decreasing and constant patterns. The general model is defined as: where and represent frf and fdr respectively Later on Pachauri et al [18] described frf as inflexion S-Shaped function for a multi-release software system. Chatterjee et al [19] formulated the Weibull-type frf under perfect and imperfect debugging process.…”
Section: Introductionmentioning
confidence: 99%