2017
DOI: 10.1109/jphotov.2017.2681199
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Increased Throughput and Sensitivity of Synchrotron-Based Characterization for Photovoltaic Materials

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Cited by 10 publications
(5 citation statements)
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“…Given that the signal-tonoise ratio in XBIC measurements is rather limited by currents induced by the environment than by statistics, the integration time can be even below 1 ms if the response chain of the solar cell/amplifier/data acquisition system is fast enough. However, the scanning speed may be limiting, in particular if no continuous "fly scan mode" 35 or fast shutter is available, such that the sample degrades during the settling time prior to the measurement at each scan position. In this case, the scan step size may be increased to match the diameter of the interaction volume that ultimately limits the spatial resolution and can be larger than the probe diameter at X-ray nano-and microprobe endstations.…”
Section: ■ Resultsmentioning
confidence: 99%
“…Given that the signal-tonoise ratio in XBIC measurements is rather limited by currents induced by the environment than by statistics, the integration time can be even below 1 ms if the response chain of the solar cell/amplifier/data acquisition system is fast enough. However, the scanning speed may be limiting, in particular if no continuous "fly scan mode" 35 or fast shutter is available, such that the sample degrades during the settling time prior to the measurement at each scan position. In this case, the scan step size may be increased to match the diameter of the interaction volume that ultimately limits the spatial resolution and can be larger than the probe diameter at X-ray nano-and microprobe endstations.…”
Section: ■ Resultsmentioning
confidence: 99%
“…Synchrotron-based X-ray fluorescence microscopy was performed at beamline 2-ID-D at the Advanced Photon Source, Argonne National Laboratory, at an excitation energy of 9 keV with a 200 nm spot size, step sizes of 500 nm (1000 ppm film) and 220 nm (1 at.% film), and dwell times of 20 ms (1000 ppm film) and 25 ms (1 at.% film), which were enabled by on-the-fly data collection mode . No chemical or structural changes to the films from the beam were observed.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…We first perform an “electronic” measurement map, followed by an “elemental” map. For the electronic map, we combine high‐throughput fly‐scanning mapping that reduces scanning time to a typical 20–50 ms per point dwell time and insert beam attenuation filters to reduce X‐ray dose. This strategy takes advantage of the ≈10 3 multiplication factor of band edge electrons generated per single hard X‐ray photon and the relative ease of low‐noise amplification of pA current measurements.…”
Section: Tools To Assess Nanoscale Perovskite Chemistry and Its Optoementioning
confidence: 99%