Increasing current testing resolution

Thibeault, Claude

doi:10.1109/dftvs.1998.732159

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Delta I Ddq1

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Cited by 8 publications

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“…Delta I DDQ is shown to be superior to the conventional single threshold approach [Thibeault 1999b] and an order of magnitude resolution enhancement using an FFT technique has been reported [Thibeault 1998]. In the case of a passive defect, since all readings are elevated, deltas are small.…”

Section: Delta I Ddqmentioning

confidence: 99%

I_DDX-based test methods

Sabade

Walker

2004

ACM Trans. Des. Autom. Electron. Syst.

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Supply current measurement-based test is a valuable defect-based test method for semiconductor chips. Both static leakage current (I DDQ ) and transient current (I DDT ) based tests have the capability of detecting unique defects that improve the fault detection capacity of a test suite. Collectively these test methods are known as I DDX tests. However, due to advances in the semiconductor manufacturing process, the future of these test methods is uncertain. This paper presents a survey of the research reported in the literature to extend the use of I DDX tests to deep sub-micron (DSM) technologies.

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Section: Delta I Ddqmentioning

confidence: 99%