1995
DOI: 10.1557/proc-403-241
|View full text |Cite
|
Sign up to set email alerts
|

Indentation Fracture Studies of a BaTiO3 Thin Film on a Silicon Substrate

Abstract: It has been experimentally and theoretically found that the critical applied stress intensity factor for indentation cracking also depends linearly on the reciprocal of the square root of crack length when the indentation fracture technique is used to measure residual stresses in thin films.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 5 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?