2014
DOI: 10.1016/j.tsf.2013.10.115
|View full text |Cite
|
Sign up to set email alerts
|

Indium sulfide thin films as window layer in chemically deposited solar cells

Abstract: Indium sulfide (In 2 S 3 ) thin films have been synthesized by chemical bath deposition technique onto glass substrates using In(NO 3 ) 3 as indium precursor and thioacetamide as sulfur source. X-ray diffraction studies have shown that the crystalline state of the as-prepared and the annealed films is β-In 2 S 3 . Optical band gap values between 2.27 and 2.41 eV were obtained for these films. The In 2 S 3 thin films are photosensitive with an electrical conductivity value in the range of 10, depending on the f… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

3
18
0

Year Published

2015
2015
2019
2019

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 33 publications
(21 citation statements)
references
References 17 publications
3
18
0
Order By: Relevance
“…The intensity of predominant peak (109) is observed to be relatively high as compared to the other peaks which confirmed the polycrystalline nature with tetragonal phase of the films annealed at 450 1C. This result is well supported with earlier reported work of Shall et al [30], Loredo et al [34] and Barreau et al [35].…”
Section: X-ray Diffraction Analysissupporting
confidence: 89%
“…The intensity of predominant peak (109) is observed to be relatively high as compared to the other peaks which confirmed the polycrystalline nature with tetragonal phase of the films annealed at 450 1C. This result is well supported with earlier reported work of Shall et al [30], Loredo et al [34] and Barreau et al [35].…”
Section: X-ray Diffraction Analysissupporting
confidence: 89%
“…The ρ value of the as-grown and annealed films decreased from 33 Ω cm to 28 Ω cm, as shown in the Table. A reduction in ρ may be due to the increasing film thickness and grain size from ∼18 nm to ∼ 32 nm as confirmed by the SEM pictures ( Figure 2) and listed in the Table. Grain boundary scattering of free electrons in thicker films is less than in thinner films because of larger crystallite sizes. Since ρ is proportional to the electron scattering frequency, γ(1/ρ = N e e 2 /m * e γ), ρ decreases with increasing film thickness [12][13][14]. Moreover, a decrement in 400 600 800 1000 ρ could be attributed to an increment in electron density or mobility [n = 1/qρµ n (where n is the electron density, q is the electronic charge, and µ n is the electron mobility)] [14,15].…”
Section: Electrical Properties Of Indium Sulfide Thin Filmsmentioning
confidence: 99%
“…The indium‐sulfur (In‐S) binary metal chalcogenide system is of interest in the optoelectronics, and catalysis, research fields due to attractive properties such as the variety of crystallographic phases, and band gap of ca. 2 eV .…”
Section: Introductionmentioning
confidence: 99%
“…These applications have in common the necessity to utilize indium sulfide in its pure phases. The most easily accessed and found phases are InS, In 3 S 4 , In 6 S 7 and In 2 S 3 . Indium sulfide semiconductors are classified as non‐toxic and have potential as an alternative to the toxic cadmium sulfide buffer in cadmium gallium indium selenide/sulfide solar cells .…”
Section: Introductionmentioning
confidence: 99%