Individuality evaluation for paper based artifact-metrics using transmitted light image

Yamakoshi, Manabu; Tanaka, J.; Furuie, Makoto; Hirabayashi, Masashi; Matsumoto, Tsutomu

doi:10.1117/12.765035

Cited by 9 publications

(9 citation statements)

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“…The originality of our method is to observe illuminating pattern of material by optical excitation. (Previous works irradiate artifact with light and observe reflected or transmitted light component [7]- [16]. )…”

Section: B Addition Of Materials and Extraction Of Peculiarity Informmentioning

confidence: 99%

A Study of Applying Artifact-Metrics Technology and Baking Invisible Information onto Valuable Porcelain Products

Fujikawa¹,

Fuchi²

2015

IJMMM

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Abstract-In this paper, we propose a new method in order to verify the authenticity of porcelain product much easier by using artifact-metrics technology. In our method, counterfeiter cannot make copied product even if they could use same materials and tools which were used by the brand holder company or the ceramic artists. This method uses transparent glass phosphor powder to apply characteristic information on the surface of each product during glazing or/and painting on daily production, so that color tone created in the furnace is not affected. Our method requires no additional work for master artisan and no sophisticated skills for buyer. Besides, glass phosphor has no potential hazards to the human body and environment. In this paper, we indicate high feasibility of our method by showing results of some experiments. We also try to burn invisible information (QR code) onto the surface of each porcelain product.Index Terms-Artifact-metrics, authenticity, glass phosphor, information hiding, near infrared rays, porcelain product, spectral imaging.

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Section: B Addition Of Materials and Extraction Of Peculiarity Informmentioning

confidence: 99%

A Study of Applying Artifact-Metrics Technology and Baking Invisible Information onto Valuable Porcelain Products

Fujikawa¹,

Fuchi²

2015

IJMMM

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“…[19] 8 Distribution of the paper fibers in paper (Transmitted light image). [20] 9 Nano-artifact metrics based on silicon nanostructures formed via an array of resist pillars (Reflected near-field light image) [21], [22] …”

Section: Appendixmentioning

confidence: 99%

Feasibility of Applying Artifact-Metrics to Fine Wooden Lacquerware

Fujikawa¹,

Fuchi²

2017

IJMMM

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Abstract-We explored the feasibility of applying artifact-metrics to authenticate and identify valuable, fine lacquerware. We used a model method to consider the feasibility of this technique. In this method, lacquer liquid containing fine particles with optical properties was utilized several times to coat the base material for lacquerware so that the fine particles randomly occurred in the coating film of the lacquer. As information resulting from the optical properties of fine particles can be obtained in a contactless manner by photo shooting, the risk of degrading or scratching the surface of lacquerware by using this method is low. In the experiment using the above model, we used clear lacquer liquid that contained glass phosphor powder and coated it onto wooden base material to make sample lacquerware. We acquired an infrared (IR) image of each sample by optical excitation and found that the fine particles randomly occurred and formed a layer. The intensity of the IR light emission was determined based on the number of times the lacquer liquid was coated on the wooden base material.Index Terms-Authentication, artifact-metrics, image processing, fine wooden lacquerware.

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“…Artifact metrics are based on optical, magnetic, electrical and mechanical properties associated with objects such as ordinary paper56, magnetic microfibers7, plastics and semiconductor chips8. As the number of cloning attacks increases, nano-artifact metrics are growing in importance because they exploit physically uncontrollable processes at the nanoscale.…”

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confidence: 99%

Optical nano artifact metrics using silicon random nanostructures

Matsumoto

Yoshida

Nishio

et al. 2016

Sci Rep

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Nano-artifact metrics exploit unique physical attributes of nanostructured matter for authentication and clone resistance, which is vitally important in the age of Internet-of-Things where securing identities is critical. However, expensive and huge experimental apparatuses, such as scanning electron microscopy, have been required in the former studies. Herein, we demonstrate an optical approach to characterise the nanoscale-precision signatures of silicon random structures towards realising low-cost and high-value information security technology. Unique and versatile silicon nanostructures are generated via resist collapse phenomena, which contains dimensions that are well below the diffraction limit of light. We exploit the nanoscale precision ability of confocal laser microscopy in the height dimension; our experimental results demonstrate that the vertical precision of measurement is essential in satisfying the performances required for artifact metrics. Furthermore, by using state-of-the-art nanostructuring technology, we experimentally fabricate clones from the genuine devices. We demonstrate that the statistical properties of the genuine and clone devices are successfully exploited, showing that the liveness-detection-type approach, which is widely deployed in biometrics, is valid in artificially-constructed solid-state nanostructures. These findings pave the way for reasonable and yet sufficiently secure novel principles for information security based on silicon random nanostructures and optical technologies.

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Individuality evaluation for paper based artifact-metrics using transmitted light image

Cited by 9 publications

References 0 publications

A Study of Applying Artifact-Metrics Technology and Baking Invisible Information onto Valuable Porcelain Products

A Study of Applying Artifact-Metrics Technology and Baking Invisible Information onto Valuable Porcelain Products

Feasibility of Applying Artifact-Metrics to Fine Wooden Lacquerware

Optical nano artifact metrics using silicon random nanostructures

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