Induced nanoscale deformations in polymers using atomic force microscopy

Lyuksyutov, Sergei F.; Paramonov, Pavel; Шарипов, Руслан; Sigalov, Grigori

doi:10.1103/physrevb.70.174110

Cited by 47 publications

(54 citation statements)

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The analytical solution based on the method of images for the electrostatic problem comprising an electrically biased tip and a thin dielectric film [9] provides the expression for electrostatic term F E calculated from the image charge distribution in the following form:…”

Section: Resultsmentioning

confidence: 99%

Atomic force microscope tip spontaneous retraction from dielectric surfaces under applied electrostatic potential

et al. 2006

View full text Add to dashboard Cite

Lyuksyutov, S. F.; Paramonov, P. B.; Mayevska, O. V.; Reagan, M. A.; Sancaktar, E.; Vaia, R. A.; and Juhl, S., "Atomic force microscope tip spontaneous retraction from dielectric surfaces under applied electrostatic potential" (2006 Abstract A time-resolved method for tip' retraction at ms-scale away from dielectric surfaces has been developed. Analysis of the forces in the system comprising AFM tip, water meniscus, and polymer film suggests that an electrostatic repulsion of the tip from the surface in the double-layered (water and polymer) system, and water condensation in the tip-surface junction are the dominant factors enabling the mechanical work for tip retraction. Nanostructures of 5-80 nm height are formed in polymeric surfaces as a result. This interesting physical phenomenon could be used for nanostructures patterning in polymeric materials at enhanced aspect ratio. r

show abstract

Section: Resultsmentioning

confidence: 99%

Atomic force microscope tip spontaneous retraction from dielectric surfaces under applied electrostatic potential

et al. 2006

View full text Add to dashboard Cite

show abstract

“…First, the mean-squared electric field fluctuation (δE x ) 2 , the t = 0 limit of the correlation function in Eq. 2, is related, by a linear response argument and continuum electrostatics for a dielectric layer over a conductor [12], to ε, the static dielectric constant of the polymer film. Second, a corresponding dynamical relation between the Fourier transform in Eq.…”

Section: Nih Public Accessmentioning

confidence: 99%

Dielectric Fluctuations and the Origins of Noncontact Friction

2006

View full text Add to dashboard Cite

Dielectric fluctuations underlie a wide variety of physical phenomena, from ion mobility in electrolyte solutions and decoherence in quantum systems to dynamics in glass-forming materials and conformational changes in proteins. Here we show that dielectric fluctuations also lead to noncontact friction. Using high sensitivity, custom fabricated, single crystal silicon cantilevers we measure energy losses over poly(methyl methacrylate), poly(vinyl acetate), and polystyrene thin films. A new theoretical analysis, relating non-contact friction to the dielectric response of the film, is consistent with our experimental observations. This work constitutes the first direct, mechanical detection of friction due to dielectric fluctuations.The fundamental relationship between random forces and friction plays a pivotal role in physics, chemistry, and biology. Surprisingly, the origin of force fluctuations and friction between objects in close proximity, but not in physical contact, remains poorly understood. Such non-contact friction is important in a variety of seemingly disparate fields, including micro-and nanomechanics, trapped ions for quantum computation, and measurements of quantum gravitation at small length scales. The non-contact friction measurements reported here are motivated by recent advances in the mechanical detection of magnetic resonance [1,2]; the sensitivity in these measurements has so far been limited by non-contact friction between a cantilever tip and the sample surface [3].The advent of high sensitivity single crystal silicon cantilevers [4,5] provides a new opportunity to elucidate the mechanisms of non-contact friction. These cantilevers' combination of low spring constant and low intrinsic losses enable the detection of non-contact friction with unprecedented sensitivity. Initial work on non-contact friction using high sensitivity cantilevers by Stipe et. al measured dissipation using a conducting probe over metal and quartz substrates at tip-sample separations down to 2 nm and temperatures from 4 -300K [3]. Friction over Au (111) was found to be 7 orders of magnitude larger than predicted by Coulomb drag theories [6]; several alternative mechanisms have been suggested [7][8][9]. In this Letter we explore noncontact friction over polymer films.A single high-sensitivity silicon cantilever was used as shown in Fig. 1(a). The cantilever approached the surface in a perpendicular orientation to avoid snap-in to contact [4] and the motion of the cantilever was parallel to the surface. The cantilever was 250m long, 5m wide, and 340 nm thick, with a spring constant k = 7 × 10 −4 N/m, a fundamental resonance frequency ω c /2π = 7.385 kHz, and a quality factor Q = 31000 ( Fig. 1(b)) [5]. The tip region of the cantilever has been thinned from 340 nm to < 100 nm using a reactive ion etch. The cantilever tip has a radius of ~ 30nm and has been coated with a thin layer of platinum using a shadow mask technique [4].We measure the total friction Γ t by recording the cantilever ringdown time τ, Fig. 1(c...

show abstract

“…Such an image type is calculated using a two-dimensional convolution procedure (Liscio et al 2006) between the effective area and the KPFM image, which is reconstructed with infinitesimal lateral resolution by assigning to each point of the topographic image the asymptotical SP value of either mica or nanotube. The effective area is well described by a two-dimensional Voigt curve calculated as proportional to the perpendicular electric field of the tip along the sample surface, in which the analytical expression was calculated by Lyuksyutov et al (2004).…”

Section: Resultsmentioning

confidence: 99%

Unconventional nanotubes self-assembled in alumina channels: morphology and surface potential of isolated nanostructures at surfaces

Palermo

Liscio

Talarico

et al. 2007

Phil. Trans. R. Soc. A.

View full text Add to dashboard Cite

Synthetic nanographenes have been self-assembled from solution on the surface of nanometric channels of an alumina membrane template. By controlling the interplay between intermolecular and interfacial interactions, the molecules have been adsorbed either 'face-on' or 'edge-on' on the pore's surfaces, leading to the formation of columnar stacks in the latter case. Upon thermal treatment at high temperature, the molecular cross-linking of the columns has been triggered, transforming the delicate supramolecular arrangement into robust carbon nanotubes, with the graphitic planes at predetermined orientations with respect to the tube axis. Scanning force microscopy characterization of single nanotubes deposited from suspensions on mica showed that the nanotubes can selfassemble on flat surfaces adopting preferential alignments which reflect the threefold symmetry of the mica substrate. Kelvin probe force microscopy studies revealed that the nanotubes possess a surface potential much smaller than the work function of both graphite and conventional vacuum-processed nanotubes, providing evidence for their more confined electronic structure.

show abstract

Induced nanoscale deformations in polymers using atomic force microscopy

Cited by 47 publications

References 16 publications

Atomic force microscope tip spontaneous retraction from dielectric surfaces under applied electrostatic potential

Atomic force microscope tip spontaneous retraction from dielectric surfaces under applied electrostatic potential

Dielectric Fluctuations and the Origins of Noncontact Friction

Unconventional nanotubes self-assembled in alumina channels: morphology and surface potential of isolated nanostructures at surfaces

Contact Info

Product

Resources

About